EDAPS 2025: IEEE ELECTRICAL DESIGN OF ADVANCED PACKAGING AND SYSTEMS
TALK KEYWORD INDEX

This page contains an index consisting of author-provided keywords.

3
3D stacked IC
3D-SiP(System in Package)
A
Absorptive common-mode filter
Adaptive frequency sampling
adhesion
Advanced package
AI
Ansys Simulation
antenna array
B
Band stop Filter
Behavioral models
bow-tie antenna
broadband modeling
broadside coupling
built-in test circuit
C
carbon nanotube
Chemical Potential
Chiplet
Chiplet interface
Circuit Model
circuit simulation
Clustering
Clustering Algorithm
Common-Mode Filter
common-mode noise
component placement
conic arrays
counterfeit electronic components
Crosstalk
CTE
D
D-band
Decoupling capacitor
decoupling network (DN)
DeepONet
defected ground structure
Defected Ground Structure (DGS)
Differential Signaling
Differential-mode (DM) noise
differential-mode signal
DPC
Dual In-Line Package (DIP)
E
EDAPS2025
efficiency
elastic modulus
electromagnetic absorber
Electromagnetic Analysis Simulator
Electromagnetic Bandgap (EBG)
Electromagnetic Interference (EMI)
electromigration
EM problems
EMC Design
equivalent circuit model
Eye-diagram estimation
F
Field programmable gate array
fine-pitch wiring
finite element method
Flexible substrate
Fourier transform
G
Gaussian processes
Generative Adversarial Imitation Learning (GAIL)
generative adversarial network
glass interposer
glass substrate
graph neural network
Graphene
graphite carbon
H
heat dissipation
heterogeneous memory
heterogeneous multilayered packaging
hierarchical reinforcement learning
high bandwidth flash (HBF)
high bandwidth memory
High wire density
Holographic memory
horizontal polarization
HPC
Huray surface roughness model
I
IDDQ testing
identification
impedance bandwidth
Inkjet printing
integrated circuit
interconnect test
interconnection channel
interposer
L
Laplace transform
large-scale AI inference
lossy resonator filter
M
Machine Learning
measurement
measurement setup
mesh plane
Meshed ground plane
Micro-Modeling Circuit (MMC)
microstrip line
mmW
mmW Radar
mode-division multiplexed transmission
multiple power domain
O
Optoelectronic VLSI
organic core
P
package substrate
package-level EMC
PAM-4
partial element equivalent circuit (PEEC)
passive amplifier
PCB
PCB layout
Physics-informed kernels
polynomial chaos expansion
power
power amplifier
power bus resonance
power distribution network
power supply induced jitter
pre emphasis
pressure bonding
printed circuit board
Printed electrodes
R
Radio Frequency Interference (RFI)
radome
RAM
Rational macromodeling
recurrent neural network
resistive open defect
S
S-parameter
SEM
Semiconductor Packaging
server
Shielded twisted quad cable
shielding effectiveness
Signal integrity
signal integrity (SI)
Silicon interposer
simulation analysis
slot antenna
Statistical analysis
Stepped Impedance Resonator (SIR)
Surface Plasmon Polaritons (SPPs)
Surface roughness
Switch Transformer
T
TA-Ag nanoparticles
temperature cycle test
tensor train decomposition
test
test1
test2
test3
test4
Thermal Integrity (TI)
thermal management solution
transformer models
transient thermal analysis
transmission performance
U
UCIe(Universal Chiplet Interconnect express)
UCIe-S
uncertainty quantification
Universal chiplet interconnect express
Universial Chiplet Interconnect Express (UCIe)
V
vector fitting method
VPD
VRM
W
warpage
wirebonding
wireless link
X
x-y footprint
Ψ
ΨJB