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Conference: IIRW-2023 (2023 IEEE International Integrated Reliability Workshop)

This page shows all presentations from this conference published in EasyChair Smart Slide.

Modulation of HCI in I/O Analog Devices Through Process Specifications

Modulation of HCI in I/O Analog Devices Through Process Specifications

Cheikh Diouf, Alain Bravaix, Xavier Federspiel, Celestin Doyen, Victor Yon, Leo Basset and Xavier Garros

Current Driven Modelling and SILC Investigation of Oxide Breakdown Under off-State TDDB in 28nm Dedicated to RF Applications

Current Driven Modelling and SILC Investigation of Oxide Breakdown Under off-State TDDB in 28nm Dedicated to RF Applications

Tidjani Garba Seybou, Alain Bravaix, Xavier Federspiel, Joycelyn Hai, Cheikh Diouf and Florian Cacho

Ruthenium Metallization and via Prefill for Electromigration Reliability Enhancement in Power Delivery Networks

Ruthenium Metallization and via Prefill for Electromigration Reliability Enhancement in Power Delivery Networks

Simone Esposto, Giuliano Sisto, Ivan Ciofi, Dragomir Milojevic, Kristof Croes and Houman Zahedmanesh

Presentations in this collection: 3
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