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Author: Joycelyn Hai

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Current Driven Modelling and SILC Investigation of Oxide Breakdown Under off-State TDDB in 28nm Dedicated to RF Applications

Current Driven Modelling and SILC Investigation of Oxide Breakdown Under off-State TDDB in 28nm Dedicated to RF Applications

Tidjani Garba Seybou, Alain Bravaix, Xavier Federspiel, Joycelyn Hai, Cheikh Diouf and Florian Cacho

Presentations in this collection: 1
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