Conference: IIRW-2025 (2025 IEEE International Integrated Reliability Workshop)

Conference: IIRW-2025 (2025 IEEE International Integrated Reliability Workshop)

This page shows all presentations from this conference published in EasyChair Smart Slide.

28nm FD-SOI I/O Transistor Hot-Carrier Injection at Cryogenic Temperature

28nm FD-SOI I/O Transistor Hot-Carrier Injection at Cryogenic Temperature

Goran Durand, Flavio-Enrico Bergamaschi, Mikaël Cassé, Xavier Federspiel, Philippe Galy, Emmanuel Vincent and Irina Ionica

Presentations in this collection: 1