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Author: Mohit Sharma

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In-field testing using In-system deterministic ATPG patterns (IS-EDT)

In-field testing using In-system deterministic ATPG patterns (IS-EDT)

Ashrith S Harith, Subramanian Mahadevan, Nilanjan Mukherjee, Varun Sehgal, Saket Goyal and Mohit Sharma

Presentations in this collection: 1
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