In-Field Test has for long relied on using Built-in self-test (BIST). This involves power-on, power-off and testing during device operation. Hyperscalar datacenters that often-run large-scale AI/ML applications need to run periodic testing of device in-field. This is necessary to prevent interruptions caused by Silent Data Corruption (SDC). For this, targeted portions of the device must be accessible for testing, while rest of the device is running in functional mode. This poster explores method to test the device In-field using In-System Embedded Deterministic Test (IS-EDT) patterns delivered through Streaming Scan Network (SSN). The In-System Test Controller (ISTC) runs IS-EDT patterns and can also use an IJTAG network to run BIST capabilities.