Sanket Vinod Thakur is a semiconductor test engineering leader driving cost-of-test innovation at Qualcomm Technologies, Inc., San Diego, CA. As a Senior Staff Test Engineer, he serves as a test engineering lead who guides complex products from concept through silicon bring-up to full production release. He pioneers machine learning applications for yield generation, test time reduction, and RMA detection across high-volume SoC manufacturing, and architects novel test hardware with embedded self-test capabilities for emerging technologies.

He has driven test engineering and production enablement across a vast range of Qualcomm's flagship products, spanning high-performance mobile application processors, baseband modems, RF transceivers, Wi-Fi and connectivity SoCs, and mixed-signal IPs, delivering cross-technology test solutions across digital, RF, and mixed-signal domains. His prior role as Senior Product Engineer at Qualcomm (2013–2015) deepened his expertise in SoC new product introduction, fault isolation, reliability qualification, and production yield optimization across similarly diverse product families. He also brings mixed-signal product engineering experience from Analog Devices, Inc. (2012–2013).

Sanket holds an M.S. in Electrical Engineering from Syracuse University and is pursuing a Ph.D. at Arizona State University, focused on adaptive, AI-driven test methodologies. He holds a granted Indian patent, has co-authored publications at ISOCC-2011 and IEEE ASSCC-2011, and earned recognition at the International VLSI Design Conference 2013 and Cadence Student Design Contest India 2012. His breadth of product experience combined with his research vision positions him as an emerging thought leader shaping the future of intelligent semiconductor test.