Valentin Gherman received the Diploma in Physics from the University of Siegen, Germany, in 2000. In 2006, he obtained the PhD degree at the University of Stuttgart, Germany, in the field of logic built-in self-test. Since 2006, he is with the Atomic Energy and Alternative Energies Commission (CEA), France. As expert in error-masking, he was involved in the specification and development of reliability solutions for storage, memory and processor systems. He is author of twelve patents and several scientific papers. His main research interests include: design for test; in-situ monitoring; error-control coding; logic optimization.