PROGRAM FOR THURSDAY, NOVEMBER 2ND: TALK VIEW
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9:00
9:30
10:00
10:30
11:00
11:30
12:00
12:30
13:00
13:30
14:00
14:30
15:00
15:30
09:00-09:30
Ying Zhang, Krishnendu Chakrabarty, Huawei Li, Jianhui Jiang
09:30-10:00
Sonal Pinto, Michael S. Hsiao
10:00-10:30
Christopher Lukas, Farah Yahya, Ben Calhoun
09:00-09:30
Constantinos Xanthopoulos, Peter Sarson, Heinz Reiter, Yiorgos Makris
10:00-10:30
Mhira, Huard, Benhassain, Cacho, Meyer, Naudet, Jain, Parthasarathy, Bravaix
09:30-10:00
Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu
10:00-10:30
Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu
09:00-09:30
V Prasanth, Rubin Parekhji, Bharadwaj Amrutur
09:30-10:00
T. Kogan, Y. Abotbol, G. Boschi, G. Harutyunyan, I. Kroul, H. Shaheen, Y. Zorian
10:00-10:30
L.-C. Wang, S. Siatkowski, C. Shan, M. Nero, N. Sumikawa, L. Winemberg
11:00-12:00 Keynote - Automotive
14:00-15:30 Hot Topic Virtual Panel - What does the Test Community really think about System-Level Test?
14:00-15:30 Yield Learning at the Crossroads – Test Chips to the Rescue?
14:00-15:30 Automotive Panel
15:00-15:30
Steve Sunter