PROGRAM FOR THURSDAY, NOVEMBER 2ND: SESSION VIEW
Days:
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View: with abstractstalk overview
9:00
9:30
10:00
10:30
11:00
11:30
12:00
12:30
13:00
13:30
14:00
14:30
15:00
15:30
09:00-10:30
Session 11
Functional and Software-based Test
09:00-10:30
Session 12
Die Inking, Test Chips and Aging
09:00-10:30
Session 13
Status Monitoring
09:00-10:30
Session 14
Safety and Test for Automotive ICs
11:00-12:00
Session K3
Keynote - Automotive
14:00-15:30
Session P4
Automotive Panel