ESREF 2020: 31ST EUROPEAN SYMPOSIUM ON RELIABILITY OF ELECTRON DEVICES, FAILURE PHYSICS AND ANALYSIS
PROGRAM FOR THURSDAY, OCTOBER 8TH: TALK VIEW
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9:00
9:30
10:00
10:30
11:00
11:30
12:00
12:30
13:00
13:30
14:00
14:30
09:00-09:20
Ze He, Chang Cai, Tianqi Liu, Bing Ye, Lihua Mo, Jie Liu
09:40-10:00
T. Liu, D. Li, C. Cai, P. Zhao, C. Shen, J. Liu, G. Yang
10:00-10:20
Junchao Chen, Thomas Lange, Marko Andjelkovic, Aleksandar Simevski, Milos Krstic
09:20-09:40
Qin, Iyer, Steinwall, Watkins, Chang, Casteel, Morgan, Thomason
09:40-10:00
Z. Wang, B. Li, J. Wu, W. Zhao, B. Li, H. Liu, C. Guan, S. Feng, J. Luo, T. Ye
10:00-10:20
L. Curos, T. Dubois, G. Mejecaze, F. Puybaret, B. Plano, J.-M. Vinassa
10:40-11:00 Break
11:00-11:20
Massimo Vanzi, Giovanna Mura
12:30-13:00
Martin Kuball
11:00-11:20
Janioud, Poulain, Koumela, Armani, Dupret, Rey, Berthelot, Jourdan, Morfouli
11:40-12:00
Birmpiliotis, Koutsoureli, Stavrinidis, Konstantinidis, Papaioannou
12:50-13:50 Break
13:10-14:10 Invited - Best Paper Awards
14:10-14:30 ESREF 2020 - Closing Remarks