DCIS 2017: XXXII CONFERENCE ON DESIGN OF CIRCUITS AND INTEGRATED SYSTEMS
TALK KEYWORD INDEX

This page contains an index consisting of author-provided keywords.

3
3D printing
A
active inductor
active mixer
ADC
Admittance cycles
aging
all-pass filter
Alternate Test
Amplifier
Amplifiers
analog electronics
Analog integrated circuits
Arteriosclerosis
artificial neural network
autonomous gateway
autonomous network
B
basic electronics
BET
Bias Temperature Instability (BTI)
BiCMOS
BioImpedance
Biomedical
Biomedical Electronics
Biomedical Engineering
Bistability
Body bias
Boolean Chaos
Break Even Time
C
capacitive sensors
Cardiology
Catastrophic Defects
cathode filament
CDC
Channel Hot Carriers injection (HCI)
Charge pumps
Chopper
Class AB circuits
CMOS
CMOS integrated circuits
CMOS RFIC
CMOS-MEMS
comparator decision error
Computer Vision
conductive filaments
Cookies platform
current boosting
current crowding
Current Model
current reuse
Cyber-Physical Production System
D
DC-DC Converters
degradation
delay
delay-bandwidth-product
Delta-Sigma Modulator
design for testability
Design methodology
Design placement
Dielectric characterization
differential sensor
digital circuit
digital microphone
digital redundancy
Dual-Slope
E
ECC cryptography
echo state network
educational robots
Electroless plating
Electromechanical nonlinearities
electronic components
EM pulse injection
embedded system
Embedded Systems
Emotion Recognition
emulation
Energy-Overhead
engineering students
Error Correcting Codes
error detection
F
fault attacks
fault injection
fault injection platform
fault-tolerance
Field Programmable Gate Array
FinFET
flicker
FPGA
frontend-of-line dielectric breakdown
Fully integrated switched-capacitor power converter wide input
G
gas sensor interface
gateway
GOBD
Graphical Processing Units
H
Hardware Acceleration
hardware neural network
heater
High Level Syntehsis
High Performance Computing
High-Level Synthesis
high-SPL
Hyperspectral Imaging
I
IEEE 802.15.4
Implantable Biomedical Devices
inductor
instruction set architecture
instrumentation
Integrator
Intelligent Systems
Internet of Things
interpolators
IoT in Industry
K
K-Nearest Neighbors
L
LFP
LHC
lifetime
Linear Feedback Shift Register
LNA
low
Low Drop-Out (LDO) Voltage Regulators
Low power
low-noise
low-noise amplifier (LNA)
low-power
Low-Power Electronics
M
Machine Learning
magnetron
Marker detector
Massively Parallel Processing
Matlab/Simulink
MCU
Medical test
memristor
Memristors
MEMS
MEMS resonators
MEMS-Based Oscillators
microcontroller
microelectronic design
microprocessor testing
middle-of-line breakdown
Millimeter-waves
Mixed-Signal Circuits
Modeling
Modeling of Power Converters
Modulation
Monitoring Containers
mote
MOX
N
Nerual
networked embedded systems
Neurotrophic circuits and systems
NIST test
O
ocean monitoring
Octree Encoding
OFDM
Offset calibration
OpenCL
openrisc
Oscillation-Based Test (OBT)
P
Parallel Computing
passives
PEEC
Performance
PID
Piezolectric Transducers
Positioning System
power
Power Electronics
power loss
Power On Reset
pressure sensor
Principal Component Analysis
Problem-based learning (PBL)
Programmable Logic
pulsed laser
Q
Quantum computing
Quantum error correction
Quantum system architecture
R
radio-frequency circuit
ramp rate
Random Forest
Random number generator
Random Telegraph Noise (RTN)
Real-time processing
Reconfigurable Electronics
Recording
Rectifiers
Reliability
reliability simulation
reservoir computing
resistance-to-frequency
Resistive memories
Resistive Random Access Memory (RRAM)
resistive switching memory
RF receiver front-end
RFIC
RHBD
robot control
robot programming
RRAM
RTOS
S
SAD
SBU
Scalable Video Coding
secure scan-paths
self-healing
self-powered microsystem
sensor interface
sensor network
sensor node
sensors
SET
SET generation
SET propagation
setup
SEU
SIFT
Silicon-on-insulator
simulation methodology
simulink
single electron transistor
Single event upset
single switch
skin effect
smart factories
Smart Sensors
Soft error
software-based self-test
SOTB
SPICE model
SRAM
SRAM-based FPGA
stacked receiver
Stereo Vision
stochastic computing
Structural Test
Successive Approximation Register (SAR) ADC
Supervised Learning
Support Vector Machine
Sustainability
Sustainable Electronics
sustained-amplifier
Switched Capacitors
Switching
SystemC
T
Ta2O5:ZrO2 ALD films
temporal pattern recognition
test compaction
thermomechanical noise
TID
time-dependent dielectric breakdown
Time-Overhead
time-series classification
Transition
transmission line
U
Ultra-low voltage circuits
Ultrasonic Communication
unit cell design
Urban Networking
uVrms
uW
V
variability
Variable-Mirror-Amplifier
VHDL
W
wearout
WEEE
wide-band
Wireless Sensor Networks
Y
yield calculation
Z
Zero Voltage Switching
ZynQ