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Author:Peter Wang

Publications
Design-for-Test Strategies for Chiplets and Multi-Chip Module Integrations
Peter Wang
EasyChair Preprint 15965
Switch-Mode based Interposer developed to self-test an MCM without Known Good Dice
Peter Wang
EasyChair Preprint 3572

Keyphrases

AI, BEOL, Boundary Scan2, chiplet, Chiplets, DDR, deep learning, DFT, FCT, IEEE1149, Interposer, JTAG, KGD, Known-Good-Die, Machine Intelligence, MCM2, self-test, substrate.

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