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![]() Title:Unified UVM Testbench: Integrating Random, Directed and Pseudo-Random Verification Capabilities Conference:DVCon Europe 2025 Tags:UVM Directed TB, UVM Pseudo Random Testbench, UVM Random Testbench and UVM Unified Testbench Abstract: Most testbench environments use separate setups for random, pseudo-random, and directed verification strategies, leading to duplicate efforts and limited reusability. This fragmentation results in redundant development, inconsistent methodologies, and delays in verification cycles. As projects progress—from directed tests early on to random exploration in the middle and pseudo-random patterns for targeted coverage closure toward the end—maintaining isolated environments becomes inefficient. The proposed solution is a unified UVM-based testbench that integrates all verification modes into a single configurable environment. By supporting mode selection through configuration, dynamic layering of sequences, and utilizing a reusable testbench library, this approach reduces overhead, enhances reusability from IP to SoC levels, and streamlines test development throughout the verification lifecycle. Unified UVM Testbench: Integrating Random, Directed and Pseudo-Random Verification Capabilities ![]() Unified UVM Testbench: Integrating Random, Directed and Pseudo-Random Verification Capabilities | ||||
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