This page shows all presentations from this conference published in EasyChair Smart Slide.
Moving Adaptive Test to “AI Test”
Dave Armstrong
Polynomial Chaos modeling for Jitter estimation in high-speed links
Majid Ahadi Dolatsara, Huan Yu, Jose Hejase, Wiren Dale Becker and Madhavan Swaminathan
EMFORCED: EM-based Fingerprinting Framework for Counterfeit Detection with Demonstration on Remarked and Cloned ICs
Andrew Stern, Ulbert Botero, Bicky Shakya, Haoting Shen, Domenic Forte and Mark Tehranipoor
Production Tests Coverage Analysis in the Simulation Environment
Niveditha Manjunath, Dieter Haerle, Stephen Sabanal, Herbert Eichinger, Hermann Tauber, Andreas Machne, Christian Manthey, Mikko Väänänen, Radu Grosu and Dejan Nickovic
Improving Diagnosis Efficiency via Machine Learning
Qicheng Huang, Chenlei Fang, Soumya Mittal and Shawn Blanton
A Stressed Eye Testing Module for Production Test of 30-Gbps NRZ Signal Interfaces
Kiyotaka Ichiyama, Takashi Kusaka and Masahiro Ishida
IJTAG Integrity Checking with Chained Hashing
Senwen Kan and Jennifer Dworak
Artificial Neural Network Based Test Escape Screening Using Generative Model
Michihiro Shintani, Yoshiyuki Nakamura and Michiko Inoue
Test methodology for PCHB/PCFB based asynchronous pipeline circuits
Ting-Yu Shen, Chia-Cheng Pai, Tsai-Chieh Chen, Samuel Pan and James Chien-Mo Li