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Title:EMFORCED: EM-based Fingerprinting Framework for Counterfeit Detection with Demonstration on Remarked and Cloned ICs
Authors:Andrew Stern, Ulbert Botero, Bicky Shakya, Haoting Shen, Domenic Forte and Mark Tehranipoor
Conference:ITC 2018
Tags:Counterfeit Detection, counterfeit ic detection, Electromagnetic Measurements, em based counterfeit detection, em based fingerprinting, Hardware Security, Machine Learning, Principal Component Analysis, Supply Chain Security and unsupervised machine learning
Abstract:

Today's globalized electronics supply chain is prone to counterfeit chip proliferation. We propose a novel method of counterfeit integrated circuit detection which utilizes design-specific electromagnetic fingerprints generated by clock distribution networks.

 
EMFORCED: EM-based Fingerprinting Framework for Counterfeit Detection with Demonstration on Remarked and Cloned ICs
 
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