EMFORCED: EM-based Fingerprinting Framework for Counterfeit Detection with Demonstration on Remarked and Cloned ICs

Title:EMFORCED: EM-based Fingerprinting Framework for Counterfeit Detection with Demonstration on Remarked and Cloned ICs

Authors:Andrew Stern, Ulbert Botero, Bicky Shakya, Haoting Shen, Domenic Forte and Mark Tehranipoor

Conference:ITC 2018

Tags:Counterfeit Detection, counterfeit ic detection, Electromagnetic Measurements, em based counterfeit detection, em based fingerprinting, Hardware Security, Machine Learning, Principal Component Analysis, Supply Chain Security and unsupervised machine learning

Abstract:

Today's globalized electronics supply chain is prone to counterfeit chip proliferation. We propose a novel method of counterfeit integrated circuit detection which utilizes design-specific electromagnetic fingerprints generated by clock distribution networks.