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Author: Thomas R. Lechtenberg

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Development of an Ontology for Defect Classification in Remanufacturing

Development of an Ontology for Defect Classification in Remanufacturing

Thomas R. Lechtenberg, Elif Elcin Günay, Chih-Yuan Chu, Gül E. Kremer, Paul A. Kremer and John K. Jackman

Presentations in this collection: 1
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