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Author: Edward Wyrwas

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Effects of Workload on Radiation Vulnerability of RISC-V System-on-Chip

Effects of Workload on Radiation Vulnerability of RISC-V System-on-Chip

Seth Roffe, Scott Stansberry, Edward Wyrwas and Steven Guertin

An Examination of the Radiation Tolerance of Electronic Displays for Future Crewed Missions

An Examination of the Radiation Tolerance of Electronic Displays for Future Crewed Missions

Justin Bautista, Landen Ryder, Edward Wyrwas, Geraldo Cisernos, Xiaojing Xu, Michael Campola and Razvan Gaza

Presentations in this collection: 2
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