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Author: Thomas Borel

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Lot-to-Lot Variability and TID Degradation of Bipolar Transistors Analyzed with ESA and PRECEDER Databases

Lot-to-Lot Variability and TID Degradation of Bipolar Transistors Analyzed with ESA and PRECEDER Databases

Pedro Martín-Holgado, Amor Romero-Maestre, José de-Martín-Hernández, Florian Krimmel, Thomas Borel, Michele Muschitiello, Alessandra Costantino, Ferdinando Tonicello, Christian Poivey, Anastasia Pesce, Olga Ramos, Manuel Domínguez and Yolanda Morilla

Presentations in this collection: 1
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