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Author: Jesse K. Mee

This page shows all presentations of this author published in EasyChair Smart Slide.

The Effect of MCUs and Single-Word MBUs on the ECC Failures of a Radiation Hardened Microcontroller

The Effect of MCUs and Single-Word MBUs on the ECC Failures of a Radiation Hardened Microcontroller

Stefania Esquer, Jesse K. Mee, Heather M. Quinn, Windy S. Slater, Ronald D. Schrimpf and Brian D. Sierawski

Presentations in this collection: 1
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