ITC 2017: INTERNATIONAL TEST CONFERENCE 2017
Ying Zhang
Organization: tongji university
Pages in this Program
Program
Program for Thursday, November 2nd
Bio

Ying Zhang received his B.S. degree in computer science from Harbin Engineering University, Harbin, China, in 2006, and Ph.D. degree from Institute of Computing Technology, Chinese Academy of Sciences, Beijing, China, in 2011, respectively. Later, he continued his research in Embedded Systems Lab, Linköping University, Sweden. Now, he is an associate professor at Tongji University, Shanghai. His research interests include signal integrity, reliable design of network-on-chip, and software-based self-testing. He is a member of IEEE.