Welcome Message

It is our privilege to welcome you to the 47th International Test Conference (ITC) sponsored by IEEE and the IEEE Philadelphia Section. ITC is the world’s premier conference dedicated to electronics test.  Our volunteer committees worked very hard to provide to you an exciting event with a balance of the latest research, practical applications, and networking opportunities.  We are holding ITC in Fort Worth, Texas the week of November 14, 2016. 

Our topics include heterogeneous integration, high-speed interface, emerging devices, emerging test needs for automotive and IoT, hardware security, system test, analog and mixed-signal test, ATE, yield learning, test analytics, pre-silicon test optimization, test cost, test methodology, test standards, and industrial practices.

The conference is organized in a way to provide you various methods to learn and discuss topics related to electronics test.  Our keynote speakers (list) are well known industry leaders and academic researchers that provide exciting insights.  The technical papers are 20 minute presentations of papers that were selected from a rigorous review process with a few minutes for questions at the end of each paper.  The exhibition floor consists of solutions providers who are available to discuss and learn about their offerings.  A corporate forum is held on the exhibit floor where exhibiting companies present about their products.  This year we have one poster session held on the exhibition floor.  Posters provide a very comfortable and informal environment to discuss details with the authors. 

We recognize that networking is extremely valuable to our attendees.   Multiple breaks and social events are integrated in the program to allow you to network with colleagues and other specialists.  Free lunches are provided in the exhibit hall for full- and one-day ITC conference attendees. 

On behalf of the 2016 International Test Conference steering committee, program committee and all the dedicated volunteers who are key to making the program complete, we welcome you to this year’s exciting technical program and exhibits.

General Chair, Ron Press, Mentor Graphics Corporation

Program Chair, Li-C. Wang, University of California, Santa Barbara