ICEC 2020: 30TH INTERNATIONAL CONFERENCE ON ELECTRICAL CONTACTS 2020
PROGRAM

Days: Monday, June 7th Tuesday, June 8th Wednesday, June 9th Thursday, June 10th Friday, June 11th

Monday, June 7th

View this program: with abstractssession overviewtalk overview

12:40-13:10 Session 3: Keynote
Chair:
Werner Johler (Littelfuse, Switzerland)
Location: Stage 1
12:40
Paul Slade (Consultant, United States)
Circuit Control Development since the First International Conference on Electrical Contacts (1961 to 2020)
13:10-13:30 Session 4
Chair:
Werner Johler (Littelfuse, Switzerland)
Location: Stage 1
13:10
Xu Zhang (Harbin Institute of Technology, China)
Wanbin Ren (Harbin Institute of Technology, China)
Duanlin Jiang (G&A Electronics Ltd. Co., China)
Yinghua Fu (Chixi Technology Co., China)
Yide Cai (Harbin Institute of Technology, China)
A novel experimental evaluation method of welding characteristics for contact materials
PRESENTER: Xu Zhang
13:30-13:50 Session 5
Chair:
Werner Johler (Littelfuse, Switzerland)
Location: Stage 1
13:30
Peter Zeller (University of Applied Sciences Upper Austria, Austria)
Series Electric Plasma Discharges of Failing Contacts up to 10 A at Various Materials
13:50-14:10 Session 6
Chair:
Werner Johler (Littelfuse, Switzerland)
Location: Stage 1
13:50
Jean Baptiste Humbert (Univ Lorraine IJL CNRS, France)
Patrick Schweitzer (Univ lorraine IJL CNRS, France)
Serge Weber (Univ lorraine IJL CNRS, France)
Robert Hugon (Univ lorraine IJL CNRS, France)
Measurement and study of arc noise fluctuation by fast camera observations
14:10-14:30 Session 7
Chair:
Werner Johler (Littelfuse, Switzerland)
Location: Stage 1
14:10
Fabien Volpi (SIMaP, France)
Solène Comby-Dassonneville (SIMaP, France)
Marc Verdier (SIMaP, France)
Electrically-functionalised nanoindenter integrated in-situ in a Scanning Electron Microscope : case studies
PRESENTER: Fabien Volpi
14:30-15:00Break
15:00-15:20 Session 8A
Chair:
Werner Johler (Littelfuse, Switzerland)
Location: Stage 1
15:00
Manfred Lindmayer (TU Braunschweig, Germany)
David Elmiger (Rockwell Automation Switzerland, Switzerland)
Recovery of Short AC Switching Arcs – An Old Principle Newly Investigated
15:00-15:20 Session 8B
Chair:
Mike Böning (Plansee Powertech AG, Switzerland)
Location: Stage 2
15:00
Sergey Gortschakow (Leibniz Institute for Plasma Science and Technologyy, Germany)
Diego Gonzalez (Leibniz Institute for Plasma Science and Technology, Germany)
Dirk Uhrlandt (Leibniz Institute for Plasma Science and Technology, Germany)
Mike Boening (PLANSEE Powertech AG, Switzerland)
Sabine Boening (PLANSEE Powertech AG, Switzerland)
Influence of electrode material properties on the anode phenomena in switching vacuum arcs
15:20-15:40 Session 9A
Chair:
Werner Johler (Littelfuse, Switzerland)
Location: Stage 1
15:20
Makoto Hasegawa (Chitose Institute of Science and Technology, Japan)
Seika Tokumitsu (Chitose Institute of Science and Technology, Japan)
Arc Re-striking Phenomena in Break Operations of AgSnO2 Contacts in Inductive DC Load Conditions up to 20V-17A under External Magnetic Field
PRESENTER: Makoto Hasegawa
15:20-15:40 Session 9B
Chair:
Mike Böning (Plansee Powertech AG, Switzerland)
Location: Stage 2
15:20
Anthony Papillon (Schneider Electric, France)
Jean-Pierre Meley (Schneider Electric, France)
Jean-Pierre Gauthier (Schneider Electric, France)
Effect of contact materials process and test features on welding tendencies of vacuum interrupters during short time current test
PRESENTER: Anthony Papillon
15:40-16:00 Session 10A
Chair:
Werner Johler (Littelfuse, Switzerland)
Location: Stage 1
15:40
Asma Ramzi (Université de Rennes1, France)
Erwann Carvou (Université de Rennes1, France)
Alexis Schach (Safran Group, France)
Effects of arc during mechanical bounces on contact material for different power supply frequencies
PRESENTER: Asma Ramzi
15:40-16:00 Session 10B
Chair:
Mike Böning (Plansee Powertech AG, Switzerland)
Location: Stage 2
15:40
Ralf-Patrick Sütterlin (ABB, Switzerland)
Moritz Böhm (ABB Power Grids, Switzerland)
Thierry Delachaux (ABB, Switzerland)
Thomas Schmölzer (ABB, Germany)
Lavinia Scherf (ABB, Switzerland)
The effect of WC/Ag contact material composition on chopping currents in MV contactors
PRESENTER: Lavinia Scherf
16:00-16:20 Session 11A
Chair:
Werner Johler (Littelfuse, Switzerland)
Location: Stage 1
16:00
Christian Drebenstedt (TU Ilmenau, Germany)
Michael Rock (TU Ilmenau, Germany)
Determination of dielectric recovery characteristic of a pyro switch in commutation circuit
16:00-16:20 Session 11B
Chair:
Mike Böning (Plansee Powertech AG, Switzerland)
Location: Stage 2
16:00
Bogdan Miedzinski (Wroclaw university of Science and Technology, Poland)
Bartosz Polnik (KOMAG Gliwice, Poland)
Julian Wosik (KOMAG Gliwice, Poland)
Grzegorz Wisniewski (Wroclaw University of Science and Technology, Poland)
Marcin Habrych (Wroclaw University of Science and Technology, Poland)
Stanislaw Wapniarski (ELEKTROBUDOWA S.A., Poland)
Investigations of the Possibility of Limiting the Hazard due to Internal Arc Faults in Medium Voltage Switchgears
16:20-16:40 Session 12A
Chair:
Werner Johler (Littelfuse, Switzerland)
Location: Stage 1
16:20
Koichiro Sawa (Nippon Institute of Technology, Japan)
Kiyoshi Yoshida (Nippon Institute of Technology, Japan)
Kenji Suzuki (Fuji Electric FA Components & Systems Co., Ltd, Japan)
Influence of Load Current and Breaking Velocity on Arc Discharge at Breaking of Electrical Contacts
PRESENTER: Koichiro Sawa
16:20-16:40 Session 12B
Chair:
Mike Böning (Plansee Powertech AG, Switzerland)
Location: Stage 2
16:20
Naghme Dorraki (Norwegian University of Science and Technology (NTNU), Norway)
Marius Strand (Norwegian University of Science and Technology (NTNU), Norway)
Kaveh Niayesh (Norwegian University of Science and Technology (NTNU), Norway)
Impact of pre-strike arc on contacts degradation after short circuit current making operation in medium voltage air load break switches
PRESENTER: Naghme Dorraki
16:40-17:00 Session 13A
Chair:
Werner Johler (Littelfuse, Switzerland)
Location: Stage 1
16:40
Diego Gonzalez (Leibniz Institute for Plasma Science and Technology, Germany)
Ralf Methling (Leibniz Institute for Plasma Science and Technology, Germany)
Sergey Gortschakow (Leibniz Institute for Plasma Science and Technology, Germany)
Steffen Franke (Leibniz Institute for Plasma Science and Technology, Germany)
Shun Yu (TDK Electronics, Germany)
Frank Werner (TDK Electronics, Germany)
Spectroscopic investigation of the DC-arc in gas filled contactors under external magnetic fields regarding the effects on the arc-plasma properties
PRESENTER: Diego Gonzalez
16:40-17:00 Session 13B
Chair:
Mike Böning (Plansee Powertech AG, Switzerland)
Location: Stage 2
16:40
Yuan (School of Automation, Northwestern Polytechnical University, China)
Hu Zhao (School of Automation, Northwestern Polytechnical University, China)
Research on Arc Characteristics of Different Arc Extinguishing Medium Used in DC Contactor
PRESENTER: Yuan
17:00-17:20 Session 14
Chair:
Werner Johler (Littelfuse, Switzerland)
Location: Stage 2
17:00
Christian Reil (Ostbayerische Hochschule Amberg-Weiden, Germany)
Hans-Peter Schmidt (OTH - Technical University of Applied Sciences, Germany)
Michael Anheuser (Siemens AG, Germany)
Frank Berger (Technische Universität Ilmenau, Germany)
Study of Arcing Processes in Circuit Breakers by Means of Spatially Resolved Magnetic Field Recordings
PRESENTER: Christian Reil
Tuesday, June 8th

View this program: with abstractssession overviewtalk overview

12:00-12:30 Session 15: Keynote
Chair:
Werner Johler (Littelfuse, Switzerland)
Location: Stage 1
12:00
Xingwen Li (Xi'an Jiaotong University, China)
Silei Chen (Xi'an University of Technology, China)
Jing Wang (Shenzhen Power Supply Bureau Shenzhen, P.R.China, China)
PV Arc Fault Diagnosis and Modeling Methods: State of the Art and Perspectives
PRESENTER: Xingwen Li
12:30-12:50 Session 16A
Chair:
Werner Johler (Littelfuse, Switzerland)
Location: Stage 1
12:30
Chomrong Ou (Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Japan)
Huang Yinming (Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Japan)
Koichi Yasuoka (Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Japan)
Threshold Current of Arc-Free Commutation For Copper-Carbon Contact in a DC Hybrid Switch
PRESENTER: Chomrong Ou
12:30-12:50 Session 16B
Chair:
Dominique Freckmann (TE, Switzerland)
Location: Stage 2
12:30
Peter Jacob (Empa Swiss Fed Labs for Materials Testing and Research, Switzerland)
Failure- and degradation mechanisms in plug connectors
12:50-13:10 Session 17A
Chair:
Werner Johler (Littelfuse, Switzerland)
Location: Stage 1
12:50
Yinming Huang (Tokyo Institute of Technology, Japan)
Chomrong Ou (Tokyo Institute of Technology, Japan)
Koichi Yasuoka (Tokyo Institute of Technology, Japan)
Hybrid DC switch with a Four-block Copper-Based Tungsten Contact
PRESENTER: Yinming Huang
12:50-13:10 Session 17B
Chair:
Dominique Freckmann (TE, Switzerland)
Location: Stage 2
12:50
Yanyan Luo (Hebei University of Technology, China)
Pengyu Gao (Hebei University of Technology, China)
Hong Liang (Maintenance Company of State Grid Tianjin Electric Power Company, China)
Zihang Sun (Hebei University of Technology, China)
Jingqin Wang (Hebei University of Technology, China)
Jingying Zhao (Hebei University of Technology, China)
Jiaomin Liu (Hebei University of Technology, China)
Research on Ultrasonic Testing Technology for Wear Debris Caused by Fretting Wear of Electrical Connectors
PRESENTER: Yanyan Luo
13:10-13:30 Session 18A
Chair:
Werner Johler (Littelfuse, Switzerland)
Location: Stage 1
13:10
Frederik Anspach (TU Braunschweig, Germany)
Patrick Vieth (TU Braunschweig, Germany)
Lars Claaßen (TU Braunschweig, Institute of Highvoltage Technology and Electrical Power Systems, Germany)
Ernst-Dieter Wilkening (TU Braunschweig, Germany)
Michael Kurrat (TUBS, Germany)
Investigation and optimization of a hybrid circuit breaker for low- and medium-voltage DC-Grids
PRESENTER: Frederik Anspach
13:10-13:30 Session 18B
Chair:
Dominique Freckmann (TE, Switzerland)
Location: Stage 2
13:10
Mack Mavuni (APTIV/UNIVERSITE DE RENNES 1, France)
Erwann Carvou (UNIVERSTE DE RENNES 1, France)
Gregory Lalet (APTIV, France)
Study of vibration transfer in automotive connectors for understanding of fretting corrosion damage
PRESENTER: Mack Mavuni
13:30-13:50 Session 19A
Chair:
Werner Johler (Littelfuse, Switzerland)
Location: Stage 1
13:30
Wolfgang Hauer (Eaton Industrie Austria GmbH, Austria)
Michael Bartonek (Eaton Industrie Austria GmbH, Austria)
Hartwig Stammberger (Eaton Industrie Germany GmbH, Germany)
New Switching Technology for DC Grids
PRESENTER: Wolfgang Hauer
13:30-13:50 Session 19B
Chair:
Dominique Freckmann (TE, Switzerland)
Location: Stage 2
13:30
Marcel Mainka (Weidmüller Group, Germany)
Thomas Wielsch (Weidmüller Group, Germany)
Ralph Würtele (Klüber Lubrication, Germany)
Martin Dr. Schweigkofler (Klüber Lubrication, Germany)
Influence of PFPE lubricant modifications on tribo-electrical properties of a tin contact system
PRESENTER: Marcel Mainka
13:50-14:10 Session 20A
Chair:
Werner Johler (Littelfuse, Switzerland)
Location: Stage 1
13:50
Arnd Ehrhardt (DEHN SE + Co KG, Germany)
Sven Wolfram (Technische Universität Ilmenau, Germany)
Switchgear Combination of Pyrotechnic Switch and Fuse
PRESENTER: Arnd Ehrhardt
13:50-14:10 Session 20B
Chair:
Dominique Freckmann (TE, Switzerland)
Location: Stage 2
13:50
Ana Torrealba (Laboratoire de Génie Electrique et Electronique de Paris, France)
Sophie Noël (Laboratoire de Génie Electrique et Electronique de Paris, France)
Antoine Fares Karam (Amphenol FCI, France)
Aurore Brezard-Oudot (Laboratoire de Génie Electrique et Electronique de Paris, France)
Damien Comte (Amphenol ICC, France)
Anthony Franchini (Amphenol ICC, France)
Jeffrey Toran (Amphenol ICC, United States)
Durability of some asymmetrical contact pairs for connector application
PRESENTER: Ana Torrealba
14:10-14:30 Session 21A
Chair:
Werner Johler (Littelfuse, Switzerland)
Location: Stage 1
14:10
Maosong Zhang (Ximen Hongfa Electroacoustic Co.,ltd, China)
Yiqing Zhu (Ximen Hongfa Electroacoustic Co.,ltd, China)
Design of an electromechanical relay for 5G power supply application which withstand high lightning-stroke-current
PRESENTER: Yiqing Zhu
14:10-14:30 Session 21B
Chair:
Dominique Freckmann (TE, Switzerland)
Location: Stage 2
14:10
Tobias Dyck (WAGO Kontakttechnik GmbH & Co. KG, Germany)
Andreas Bund (Technische Universität Ilmenau, Germany)
Investigation of the contact resistance as a function of the temperature for connectors and wire terminals
PRESENTER: Tobias Dyck
14:30-15:00Break
15:00-15:30 Session 22: Keynote
Chair:
Dominique Freckmann (TE, Switzerland)
Location: Stage 1
15:00
Volker Behrens (DODUCO Contacts and Refining GmbH, Germany)
Contact Materials for Electromechanical Devices – Established Technologies and Improvements to Face Future Requirements (abstract)
15:30-15:50 Session 23
Chair:
Dominique Freckmann (TE, Switzerland)
Location: Stage 1
15:30
Philip Lees (Littelfuse, United States)
Eric Hafenstein (Littelfuse, United States)
Joshua Koeppel (Littelfuse, United States)
Tony Spies (Littelfuse, United States)
The Development of Sputtered Contact Systems Replacing Electroplated Systems in Reed Switch Applications
PRESENTER: Philip Lees
15:50-16:10 Session 24
Chair:
Dominique Freckmann (TE, Switzerland)
Location: Stage 1
15:50
Sönke Sachs (TE Connectivity, Germany)
Helge Schmidt (TE Connectivity, Germany)
Marjorie Myers (TE Connectivity, United States)
Michael Leidner (TE Connectivity, Germany)
Waldemar Staborth (TE Connecitivity, Germany)
Frank Ostendorf (TE Connecitivity, Germany)
Highly durable silver-based physically deposited contact finish for the application in socket connectors
PRESENTER: Sönke Sachs
16:10-16:30 Session 25
Chair:
Dominique Freckmann (TE, Switzerland)
Location: Stage 1
16:10
Frédéric Hilty (Collini AG Switzerland, Switzerland)
Johannes Herrmann (Collini AG Switzerland, Switzerland)
An innovative silver-based coating system with high wear resistance for electrical connectors
PRESENTER: Frédéric Hilty
16:30-16:50 Session 26
Chair:
Dominique Freckmann (TE, Switzerland)
Location: Stage 1
16:30
Reinhard Wagner (Rosenberger Hochfrequenztechnik GmbH & Co. KG, Germany)
Christian Dandl (Rosenberger Hochfrequenztechnik GmbH & Co. KG, Germany)
Andreas Gruber (Rosenberger Hochfrequenztechnik GmbH & Co. KG, Germany)
Reinhard Hogger (Rosenberger Hochfrequenztechnik GmbH & Co. KG, Germany)
Michael Eicher (Rosenberger Hochfrequenztechnik GmbH & Co. KG, Germany)
Investigations on cold welding and galling of various connector platings
PRESENTER: Reinhard Wagner
16:50-17:10 Session 27
Chair:
Dominique Freckmann (TE, Switzerland)
Location: Stage 1
16:50
Haomiao Yuan (Ostwestfalen-Lippe University of Applied Sciences and Arts, Germany)
Jian Song (Ostwestfalen-Lippe University of Applied Sciences and Arts, Germany)
A Cu/Sn Multilayer System and its Fretting Corrosion Behavior
PRESENTER: Haomiao Yuan
17:10-17:30 Session 28
Chair:
Dominique Freckmann (TE, Switzerland)
Location: Stage 1
17:10
Bernd Roelfs (Atotech Deutschland GmbH, Germany)
Markus Hoerburger (Atotech Deutschland GmbH, Germany)
Alexander Spoerrer (Atotech Deutschland GmbH, Germany)
Bruno Wibberg (Atotech Deutschland GmbH, Germany)
Silver Plating for Connectors - The right combination of new gal-vanic Silver processes and anti–tarnishes
PRESENTER: Bernd Roelfs
Wednesday, June 9th

View this program: with abstractssession overviewtalk overview

12:00-12:20 Session 29A
Chair:
Günter Grossmann (EMPA, Switzerland)
Location: Stage 1
12:00
Antoine Fares Karam (Amphenol ICC, France)
Anthony Franchini (Amphenol ICC, France)
Ana Torrealba (Laboratoire de Genie Electrique de Paris, University Paris-Saclay, France)
Damien Comte (Amphenol ICC, France)
Aurore Brezard-Oudot (Laboratoire de Génie Electrique de Paris, CentraleSupelec, France)
Sophie Noel (Laboratoire de Genie Electrique de Paris, CentraleSupelec, France)
Doyle Anderson (Amphenol ICC, United States)
Jeffrey Toran (Amphenol ICC, United States)
Intercompatibility of Gold, Palladium and hard Silver based plating systems for connectors applications
12:00-12:20 Session 29B
Chair:
Jürgen Steinhäuser (ELESTA GmbH, Switzerland)
Location: Stage 1
12:00
Naoki Fukuda (Nippon Institute of technology, Japan)
Yusuke Takada (Nippon Institute of technology, Japan)
Koichiro Sawa (Nippon Institute of technology, Japan)
Takahiro Ueno (Nippon Institute of technology, Japan)
Effect on Brush Electrification Mechanism Associated with Various Ag Content of Ag Graphite Brushes.
PRESENTER: Naoki Fukuda
12:20-12:40 Session 30A
Chair:
Günter Grossmann (EMPA, Switzerland)
Location: Stage 1
12:20
Keiji Mashimo (Furukawa Electric, Japan)
Atsushi Shimoyamada (Furukawa Electric, Japan)
Hirokazu Sasaki (Furukawa Electric, Japan)
SnOx Gradient Composition Inside the Tin-plated Layer
PRESENTER: Keiji Mashimo
12:20-12:40 Session 30B
Chair:
Jürgen Steinhäuser (ELESTA GmbH, Switzerland)
Location: Stage 2
12:20
Takahiro Ueno (Nippon Institute of Technology, Japan)
Naoki Fukuda (Nippon Institute of Technology, Japan)
Koichiro Sawa (Nippon Institute of Technology, Japan)
Electrical and mechanical wear of a graphite brush having varying silver content in a slip-ring system
PRESENTER: Takahiro Ueno
12:40-13:00 Session 31A
Chair:
Günter Grossmann (EMPA, Switzerland)
Location: Stage 1
12:40
Miriam Eisenbart (fem Research Institute for Precious Metals and Metals Chemistry, Germany)
Felix Bauer (fem Research Institute for Precious Metals and Metals Chemistry, Germany)
Ulrich Klotz (fem Research Institute for Precious Metals and Metals Chemistry, Germany)
Alloy Development in the CuNiAl System for High Strength Materials
PRESENTER: Miriam Eisenbart
12:40-13:00 Session 31B
Chair:
Jürgen Steinhäuser (ELESTA GmbH, Switzerland)
Location: Stage 2
12:40
Yusuke Takada (Nippon Institute of Technology, Japan)
Naoki Fukuda (Nippon Institute of technology, Japan)
Koichiro Sawa (Nippon Institute of Technology, Japan)
Takahiro Ueno (Nippon Institute of Technology, Japan)
Relationship between sliding surface roughness of slip ring and amount of brush wear in slip ring system
PRESENTER: Yusuke Takada
13:00-13:20 Session 32A
Chair:
Günter Grossmann (EMPA, Switzerland)
Location: Stage 1
13:00
Isabell Buresch (TE Connectivity Germany GmbH, Germany)
Helge Schmidt (TE Connectivity Germany GmbH, Germany)
Sönke Sachs (TE Connectivity Germany GmbH, Germany)
Special connector requirements call for specific contact coatings: new silver alloys show characteristics never seen before
PRESENTER: Isabell Buresch
13:00-13:20 Session 32B
Chair:
Jürgen Steinhäuser (ELESTA GmbH, Switzerland)
Location: Stage 2
13:00
Yoshitaka Kubota (Railway Technical Research Institute, Japan)
Raman Spectroscopic Analysis of Carbon Film on Frictional Surface of Contact Wire
13:20-13:40 Session 33A
Chair:
Günter Grossmann (EMPA, Switzerland)
Location: Stage 1
13:20
Erika Crandall (TE Connectivity, Germany)
Frank Ostendorf (TE Connectivity, Germany)
Martin Bleicher (TE Connectivity, Germany)
Helge Schmidt (TE Connectivity, Germany)
Isabell Buresch (TE Connectivity, Germany)
Bart Kerckhof (TE Connectivity, Belgium)
Tin Free Solutions Against Whisker Growth in Press-Fit Applications
PRESENTER: Erika Crandall
13:20-13:40 Session 33B
Chair:
Jürgen Steinhäuser (ELESTA GmbH, Switzerland)
Location: Stage 2
13:20
Christian Holzapfel (Schleifring GmbH, Germany)
Tribology of electrical sliding contacts
13:40-14:30Break
14:30-15:00 Session 34: Keynote
Chair:
Günter Grossmann (EMPA, Switzerland)
Location: Stage 1
14:30
Uwe Hauck (TE Connectivity, Germany)
Where would we be without contacts? Automotive trends and impact on electromechanical componentss
15:00-15:20 Session 35A
Chair:
Günter Grossmann (EMPA, Switzerland)
Location: Stage 1
15:00
Yinglu Tang (ABB Switzerland, Switzerland)
Tim Voegtlin (ETH Zurich, Switzerland)
Sam Bodry (ETH Zurich, Switzerland)
Moritz Boehm (ABB Switzerland, Switzerland)
Microstructural evolution of Ag/MeO contact materials and influ-ence on mechanical properties
PRESENTER: Yinglu Tang
15:00-15:20 Session 35B
Chair:
Jürgen Steinhäuser (ELESTA GmbH, Switzerland)
Location: Stage 2
15:00
Maxime Porte (Aptiv, Germany)
The silver anti-tarnish affecting the electrical stability of automotive terminals
15:20-15:40 Session 36A
Chair:
Günter Grossmann (EMPA, Switzerland)
Location: Stage 1
15:20
Massimiliano Amato (ABB, Italy)
Atanu Chaudhuri (ABB, India)
Ato David (ABB, United States)
Cody Andelin (ABB, United States)
Carlene Jerram (ABB, United States)
Srinidhi Sampath (ABB, India)
Linda Jacobs (ABB, United States)
Understanding the correlation between performance, properties and microstructure of Ag based contact tips
15:20-15:40 Session 36B
Chair:
Jürgen Steinhäuser (ELESTA GmbH, Switzerland)
Location: Stage 2
15:20
Li Jie (Fuda Alloy Materials Co., Ltd, China)
Yan Xiaofang (Fuda Alloy Materials Co., Ltd, China)
Bai Xiaoping (Fuda Alloy Materials Co., Ltd, China)
Study on the Arc Erosion Characteristic and Mechanism of AgSnO2 Used in the Simulated Conditions of Automotive Relay
PRESENTER: Li Jie
15:40-16:00 Session 37A
Chair:
Günter Grossmann (EMPA, Switzerland)
Location: Stage 1
15:40
Timo Muetzel (SAXONIA Technical Materials GmbH, Germany)
Christian Hubrich (SAXONIA Technical Materials GmbH, Germany)
Johannes Tasch (SAXONIA Technical Materials GmbH, Germany)
The Impact of Arcing (AC3) on the Contact Resistance Behavior of Ag/SnO2
PRESENTER: Timo Muetzel
15:40-16:00 Session 37B
Chair:
Jürgen Steinhäuser (ELESTA GmbH, Switzerland)
Location: Stage 2
15:40
Michael Ludwig (TE Connectivity Germany GmbH, Germany)
Michael Leidner (TE Connectivity Germany GmbH, Germany)
Helge Schmidt (TE Connectivity Germany GmbH, Germany)
Frank Ostendorf (TE Connectivity Germany GmbH, Germany)
Thermal Equivalent Circuits: An Approach to Rate High-Power Connectors for Electric Mobility Applications
PRESENTER: Michael Ludwig
16:00-16:20 Session 38
Chair:
Jürgen Steinhäuser (ELESTA GmbH, Switzerland)
Location: Stage 2
16:00
Franck Stephane Djuimeni Poudeu (Mercedes-Benz AG, Germany)
Michael Beilner (Mercedes-Benz AG, Germany)
Stephan Schlegel (Technische Universität Dresden, Germany)
Influence of the aging temperature on the hardness and the temperature-specific compressive yield point of bolted joints with copper and aluminium alloys conductors for vehicle electrical systems
16:20-16:40 Session 39
Chair:
Jürgen Steinhäuser (ELESTA GmbH, Switzerland)
Location: Stage 2
16:20
Dietmar Haba (Hirtenberger Automotive Safety, Austria)
Modelling the switching behavior of pyrofuses for the protection of electric cars based on measurement data
16:40-17:20 Session 40: Keynote
Chair:
Günter Grossmann (EMPA, Switzerland)
Location: Stage 1
16:40
Frank Berger (Technische Universität Ilmenau, Germany)
Future of Electromechanical Switchgear
Thursday, June 10th

View this program: with abstractssession overviewtalk overview

12:00-12:20 Session 41A
Chair:
Hans Weichert (consultant ICEC2020, Switzerland)
Location: Stage 1
12:00
Michael Gatzsche (ABB Power Grids, Switzerland)
Alberto Zanetti (ABB Power Grids, Switzerland)
Falk Blumenroth (ABB Power Grids, Switzerland)
Qualification of Power Contacts in High-Voltage Products for IEC 115 °C Limit Temperature
PRESENTER: Michael Gatzsche
12:00-12:20 Session 41B
Chair:
Günter Grossmann (EMPA, Switzerland)
Location: Stage 2
12:00
Qingxing Su (Testing Center of Xiamen Hongfa Electroacoustic CO.,LTD., China)
Changliu Jiang (Testing Center of Xiamen Hongfa Electroacoustic CO.,LTD., China)
Ningyi Lu (Testing Center of Xiamen Hongfa Electroacoustic CO.,LTD., China)
Lei Yi (Testing Center of Xiamen Hongfa Electroacoustic CO.,LTD., China)
Research on the Corrosion Phenomenon of Iron Parts in the Internal Micro-environment of Relay
PRESENTER: Qingxing Su
12:20-12:40 Session 42A
Chair:
Hans Weichert (consultant ICEC2020, Switzerland)
Location: Stage 1
12:20
Toni Israel (Technische Universität Dresden, Germany)
Stephan Schlegel (Technische Universität Dresden, Germany)
Steffen Großmann (Technische Universität Dresden, Germany)
Tom Kufner (Stäubli Electrical Connectors AG, Switzerland)
George Freudiger (Staubli Electrical Connectors AG, Switzerland)
Recommendations for Testing the Short Circuit Behaviour of Power Plug-In Connectors
PRESENTER: Toni Israel
12:20-12:40 Session 42B
Chair:
Günter Grossmann (EMPA, Switzerland)
Location: Stage 2
12:20
Yilin Zhou (Beijing University of Posts and Telecommunications, China)
Mengqing Wang (Beijing University of Posts and Telecommunications, China)
Nan Tian (Beijing University of Posts and Telecommunications, China)
Yunjie Shi (Beijing University of Posts and Telecommunications, China)
Reliability Improvement of Gold Plated Contacts in Card Edge Connector of Power Cabinet
PRESENTER: Yilin Zhou
12:40-13:00 Session 43A
Chair:
Hans Weichert (consultant ICEC2020, Switzerland)
Location: Stage 1
12:40
Marcella Oberst (Technische Universität Dresden, Germany)
Stephan Schlegel (Technische Universität Dresden, Germany)
Steffen Grossmann (Technische Universität Dresden, Germany)
Calculations and metallographic investigations on the growth of Al2O3-layers in bimetallic contacts
PRESENTER: Marcella Oberst
12:40-13:00 Session 43B
Chair:
Günter Grossmann (EMPA, Switzerland)
Location: Stage 2
12:40
Dieter Volm (Panasonic Electric Works Europe AG, Germany)
Bernhard Fauth (Panasonic Electric Works Europe AG, Germany)
Thomas Herrle (Panasonic Industrial Devices Europe GmbH, Germany)
Influence of red phosphorous flame retarded plastic materials on relay contacts and electronic components
PRESENTER: Thomas Herrle
13:00-13:20 Session 44A
Chair:
Hans Weichert (consultant ICEC2020, Switzerland)
Location: Stage 1
13:00
John McBride (University of Southampton, UK)
Thomas Bull (University of Southampton, UK)
Kevin Cross (TaiCaan Technologies Ltd., UK)
Volumetric erosion of a structured electrical contact surface using X-Ray Computed Tomography.
PRESENTER: John McBride
13:00-13:20 Session 44B
Chair:
Günter Grossmann (EMPA, Switzerland)
Location: Stage 2
13:00
Bradley Schultz (TE Connectivity, Corporate Technology, United States)
Rodney Martens (TE Connectivity, Corporate Technology, United States)
Suvrat Bhargava (TE Connectivity, Corporate Technology, United States)
Raymond Landon (TE Connectivity, Commercial Solutions Appliance Business Unit, United States)
The Effect of Relative Humidity on the Diffusion of Brass Elements Through Tin Plating
PRESENTER: Bradley Schultz
13:20-13:40 Session 45
Chair:
Hans Weichert (consultant ICEC2020, Switzerland)
Location: Stage 1
13:20
Werner Johler (Littelfuse europe GmbH, Switzerland)
Jack Bu (Littelfuse Electronics, China)
Kevin Liang (Littelfuse Electronics, China)
Steven Hu (Littelfuse Electronics, China)
Silver based contact system enabling extremly low and stable contact resistance in mini thermal cut off devices
PRESENTER: Werner Johler
13:40-14:10Break
14:10-14:40 Session 46: Keynote
Chair:
Hans Weichert (consultant ICEC2020, Switzerland)
Location: Stage 1
14:10
Henrik Nordborg (Hochschule für Technik Rapperswil, Switzerland)
Simulations of switching devices on the example of a Circuit Breaker - the knowns, the unknowns and the way ahead
14:40-15:00 Session 47A
Chair:
Hans Weichert (consultant ICEC2020, Switzerland)
Location: Stage 1
14:40
Manfred Lindmayer (TU Braunschweig, Germany)
Remarks Concerning Arc Roots in CFD Modeling of Switching Arcs
14:40-15:00 Session 47B
Chair:
Günter Grossmann (EMPA, Switzerland)
Location: Stage 2
14:40
Wanbin Ren (Harbin Institute of Technology, China)
Chao Zhang (Harbin Institute of Technology, China)
Fubiao Luo (G&A Electronics Ltd. Co., China)
Zhen Wei (G&A Electronics Ltd. Co., China)
An improved method to identify the evolution of rough surface contact by the elliptical asperity
PRESENTER: Wanbin Ren
15:00-15:20 Session 48A
Chair:
Hans Weichert (consultant ICEC2020, Switzerland)
Location: Stage 1
15:00
Jianning Yin (Xi'an University of Technology, China)
Tian Tian (Xi'an Jiaotong University, China)
Qian Wang (Xi'an University of Technology, China)
Xingwen Li (Xi'an Jiaotong University, China)
Arc Evolution Process Considering the Motion of Moving Contact in DC Circuit Breaker
PRESENTER: Jianning Yin
15:00-15:20 Session 48B
Chair:
Günter Grossmann (EMPA, Switzerland)
Location: Stage 2
15:00
Robert Jackson (Auburn University, United States)
Yang Xu (University of Glasgow, UK)
Swarna Saha (Auburn University, United States)
Kyle Schulze (Auburn University, United States)
Elastic Rough Surface Contact and the Root Mean Square Slope of Measured Surfaces
PRESENTER: Robert Jackson
15:20-15:40 Session 49A
Chair:
Hans Weichert (consultant ICEC2020, Switzerland)
Location: Stage 1
15:20
Olga Schneider (DEHN SE + Co KG, Germany)
Arnd Ehrhardt (DEHN SE + Co KG, Germany)
Bernd Leibig (DEHN SE + Co KG, Germany)
Sebastian Schmausser (DEHN SE + Co KG, Germany)
Andrey Aksenov (Capvidia NV, Belgium)
Elena Shaporenko (Capvidia NV, Germany)
Surge protection device digital prototyping
PRESENTER: Olga Schneider
15:20-15:40 Session 49B
Chair:
Günter Grossmann (EMPA, Switzerland)
Location: Stage 2
15:20
Marius Tarnovetchi (Continental AG, Romania)
Francois Le-Rest (Continental AG, France)
Hans-Peter Tranitz (Continental AG, Germany)
Press-fit Whiskers Risk Assessment by Simulation
15:40-16:00 Session 50A
Chair:
Hans Weichert (consultant ICEC2020, Switzerland)
Location: Stage 1
15:40
Roman Fuchs (HSR University of Applied Sciences Rapperswil, Switzerland)
Numerical arc simulations of radiatively-induced PMMA nozzle wall ablation
15:40-16:00 Session 50B
Chair:
Günter Grossmann (EMPA, Switzerland)
Location: Stage 2
15:40
Stanislav Kharin (Kazakh-British Technical University, Kazakhstan)
The mathematical model of a short arc at the blow-off repulsion of electrical contacts during the transition from metallic phase to gaseous phase
16:00-16:20 Session 51A
Chair:
Hans Weichert (consultant ICEC2020, Switzerland)
Location: Stage 1
16:00
Mario Muermann (IET Institute for Energy Technology, HSR University of Applied Science Rapperswil, Switzerland)
Alexander Chusov (Streamer-Electric, St. Petersburg, Russia)
Roman Fuchs (HSR University of Applied Sciences, Switzerland)
Henrik Nordborg (HSR University of Applied Sciences, Switzerland)
Simulation-based Development of a Line Lightning Protection Device
PRESENTER: Roman Fuchs
16:00-16:20 Session 51B
Chair:
Günter Grossmann (EMPA, Switzerland)
Location: Stage 2
16:00
Boguslaw Samul (ABB Power Grids Research, Poland)
Joerg Ostrowski (ABB Corporate Research, Switzerland)
Remigiusz Nowak (ABB Power Grids Research, Poland)
Optimization of current carrying connections under STC test conditions
PRESENTER: Boguslaw Samul
16:20-16:40 Session 52A
Chair:
Hans Weichert (consultant ICEC2020, Switzerland)
Location: Stage 1
16:20
Jiaxin You (Harbin Institute of Technology, China)
Rao Fu (Harbin Institute of Technology, China)
Xiangdong Feng (Harbin Institute of Technology, China)
Bo Li (Harbin Institute of Technology, China)
Huimin Liang (Harbin Institute of Technology, China)
Research on virtual prototyping technology of dynamic characteristics for a type of hermetically sealed electromagnetic relay
PRESENTER: Xiangdong Feng
16:20-16:40 Session 52B
Chair:
Günter Grossmann (EMPA, Switzerland)
Location: Stage 2
16:20
Silei Chen (Xi'an University of Technology, China)
Xingwen Li (Xi'an Jiaotong University, China)
Jing Wang (Shenzhen Power Supply Bureau Shenzhen, P.R.China, China)
Series Arc Fault Modelling in Photovoltaic Resistive Systems
PRESENTER: Silei Chen
16:40-17:00 Session 53A
Chair:
Hans Weichert (consultant ICEC2020, Switzerland)
Location: Stage 1
16:40
Michael Martinek (e-laborate Innovations GmbH, Germany)
Robust and Efficient Software-based 3D Clearance and Creepage Analysis
16:40-17:00 Session 53B
Chair:
Günter Grossmann (EMPA, Switzerland)
Location: Stage 2
16:40
Qiya Wang (Xiamen Hongfa  Electroacoustic Co. , Ltd, China)
Zhengbin Zhang (Xiamen Hongfa Electroacoustic Co. , Ltd, China)
Thermal simulation based on fluid-solid coupling method demonstrated on an Automotive Relay
PRESENTER: Qiya Wang
17:00-17:20 Session 54A
Chair:
Hans Weichert (consultant ICEC2020, Switzerland)
Location: Stage 1
17:00
Michael Hoischen (South Westphalia University of Applied Sciences, Germany)
Shem George Varghese (South Westphalia University of Applied Sciences, Germany)
Robert Bach (South Westphalia University of Applied Sciences, Germany)
Investigations into the Mechanical Behaviour of Aluminium Conductors in Connectors for Plastic-Insulated High-Voltage Cables with large Cross-Sections using the Finite Element Method
PRESENTER: Michael Hoischen
17:00-17:20 Session 54B
Chair:
Günter Grossmann (EMPA, Switzerland)
Location: Stage 2
17:00
Minglei Dai (Xi'an Jiaotong University, China)
Yunkun Deng (Yunnan Electric Power Research Institute, China)
Xingwen Li (Xi'an Jiaotong University, China)
Study on Thermoelastic Deformation of Bimetal Sheets in Miniature Circuit Breakers
PRESENTER: Minglei Dai
Friday, June 11th

View this program: with abstractssession overviewtalk overview

12:00-12:30 Session 55: Keynote
Chair:
Michael Gatzsche (ABB Power Grids Switzerland Ltd, Switzerland)
Location: Stage 1
12:00
Christian Franck (ETH Zürich, Switzerland)
SF6 alternative gases and future switching arc research
12:30-12:50 Session 56
Chair:
Michael Gatzsche (ABB Power Grids Switzerland Ltd, Switzerland)
Location: Stage 1
12:30
Jinlong Dong (Xi’an Jiaotong University, China)
Luca Di Rienzo (Politecnico di Milano, Italy)
Guogang Zhang (Xi’an Jiaotong University, China)
Jianhua Wang (Xi’an Jiaotong University, China)
Electric Arc Reconstruction from Magnetic Field
PRESENTER: Luca Di Rienzo
12:50-13:10 Session 57
Chair:
Michael Gatzsche (ABB Power Grids Switzerland Ltd, Switzerland)
Location: Stage 1
12:50
Christian Strobl (E-T-A Elektrotechnische Apparate GmbH, Germany)
Switching and Circuit Protection in DC Grids
13:10-13:30 Session 58
Chair:
Michael Gatzsche (ABB Power Grids Switzerland Ltd, Switzerland)
Location: Stage 1
13:10
Johannes Seefried (Universität Erlangen-Nürnberg, Lehrstuhl FAPS, Germany)
Andreas Riedel (Universität Erlangen-Nürnberg, Lehrstuhl FAPS, Germany)
Andreas Lohbauer (Universität Erlangen-Nürnberg, Lehrstuhl FAPS, Germany)
Hendrik Baessler (Universität Erlangen-Nürnberg, Lehrstuhl FAPS, Germany)
Alexander Kuehl (Universität Erlangen-Nürnberg, Lehrstuhl FAPS, Germany)
Jörg Franke (Universität Erlangen-Nürnberg, Lehrstuhl FAPS, Germany)
Influencing Factors for the Ultrasonic Compacting Process of Insulated Litz Wires for Electrical Drives
13:30-13:50 Session 59
Chair:
Michael Gatzsche (ABB Power Grids Switzerland Ltd, Switzerland)
Location: Stage 1
13:30
Andreas Riedel (Universität Erlangen-Nürnberg, Lehrstuhl FAPS, Germany)
Johannes Seefried (Universität Erlangen-Nürnberg, Lehrstuhl FAPS, Germany)
Alexander Schmidt (Universität Erlangen-Nürnberg, Lehrstuhl FAPS, Germany)
Alexander Kuehl (Universität Erlangen-Nürnberg, Lehrstuhl FAPS, Germany)
Joerg Franke (Universität Erlangen-Nürnberg, Lehrstuhl FAPS, Germany)
Experimental Setup of a Process Chain for Contacting Litz Wires for Electrical Drives
PRESENTER: Andreas Riedel
13:50-14:10 Session 60
Chair:
Michael Gatzsche (ABB Power Grids Switzerland Ltd, Switzerland)
Location: Stage 1
13:50
Katrin Baeuml (Schneider Electric, Germany)
Steffen Großmann (TU Dresden, Germany)
Investigations on Different Joining Techniques Regarding Current-carrying Joints with Normal Conducting Material and YBCO Coated Conductors at low temperatures
PRESENTER: Katrin Baeuml
14:10-14:30 Session 61
Chair:
Michael Gatzsche (ABB Power Grids Switzerland Ltd, Switzerland)
Location: Stage 1
14:10
Youngwoo Kim (Nara Institute of Science and Technology (NAIST), Japan)
Daisuke Fujimoto (Nara Institute of Science and Technology (NAIST), Japan)
Yu-ichi Hayashi (Nara Institute of Science and Technology (NAIST), Japan)
Analysis of HDMI 2.1 Mated Connector Contact Boundary Impedance Impacts on a High-speed Digital System Performance
PRESENTER: Youngwoo Kim