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Revisit to Accurate ADC Testing with Incoherent Sampling Using Proper Sinusoidal Signal and Sampling Frequencies

EasyChair Preprint no. 6413

5 pagesDate: August 26, 2021

Abstract

This paper describes that the mature ADC testing method with a simple test system using the incoherent sampling and the standard algorithm of windowing and FFT with 4K-point data can measure the SINAD of our target 12-bit SAR ADC accurately by proper setting of the input and sampling frequencies, which is industry-friendly. We show the input sinusoidal signal and sampling clock frequency relationship for accurate testing of the ADC dynamic characteristics with an incoherent sampling method using a flat-top window. We have clarified the measured SINAD accuracy of the input signal frequency dependency for a fixed sampling frequency.

Keyphrases: ADC testing, FFT, flat-top window, Incoherent sampling, SINAD

BibTeX entry
BibTeX does not have the right entry for preprints. This is a hack for producing the correct reference:
@Booklet{EasyChair:6413,
  author = {Keno Sato and Takashi Ishida and Toshiyuki Okamoto and Tamotsu Ichikawa and Jiang-Lin Wei and Takayuki Nakatani and Yujie Zhao and Shogo Katayama and Shuhei Yamamoto and Anna Kuwana and Kazumi Hatayama and Haruo Kobayashi},
  title = {Revisit to Accurate ADC Testing with Incoherent Sampling      Using Proper Sinusoidal Signal and Sampling Frequencies},
  howpublished = {EasyChair Preprint no. 6413},

  year = {EasyChair, 2021}}
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