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Author:Faicel Hanien

Publications
Two-Stage Stochastic Program for Capacitated Disassembly Lot-Sizing Under Random Yield
Oumayma Laouni, Ilhem Slama, Faicel Hanien and Zied Jemai
EasyChair Preprint 11074

Keyphrases

Disassembly lot-sizing, two-stage stochastic programming, Yield Uncertainty.

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