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Author:Jean-Luc Danger

Publications
Detecting Faults in Inner-Product Masking Scheme - IPM-FD: IPM with Fault Detection
Wei Cheng, Claude Carlet, Kouassi Goli, Jean-Luc Danger and Sylvain Guilley
In:Proceedings of 8th International Workshop on Security Proofs for Embedded Systems
PROOFS 2017. 6th International Workshop on Security Proofs for Embedded Systems
Ulrich Kühne, Jean-Luc Danger and Sylvain Guilley (editors)
EPiC Series in Computing, volume 49

Keyphrases

fault detection, Inner Product Masking, optimal linear codes, provable security.

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