Ismail Dilman received a B.S. degree from the Department of Electronics and Telecommunication Engineering, Yildiz Technical University, Istanbul, Turkey, in 2009. The M.S. degree from the Program of Telecommunication Engineering, Istanbul Technical University, Istanbul, Turkey.Currently, he is working towards his Ph.D. degree in the same program. His research interests include microwave imaging, microwave dielectric spectroscopy, and inverse scattering problems.