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Keyword:automatic test generation

Papers
Differential Analysis of X86-64 Instruction Decoders
William Woodruff, Niki Carroll and Sebastiaan Peters
EasyChair Preprint no. 5095
Automatic generation of high quality test sets via CBMC
Emanuele Di Rosa, Enrico Giunchiglia, Massimo Narizzano, Gabriele Palma and Alessandra Puddu
In:VERIFY-2010. 6th International Verification Workshop
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