TuZ'22: 34. GI / GMM / ITG-Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen ATLANTIC Hotel Sail City Bremerhaven, Germany, February 27-March 1, 2022 |
| Conference website | http://www.informatik.uni-bremen.de/tuz/2022/ |
| Submission link | https://easychair.org/conferences/?conf=tuz22 |
| Abstract registration deadline | November 19, 2021 |
| Submission deadline | November 23, 2021 |
The 34th workshop on Test Methods and Reliability of Circuits and Systemsis the most significant German forum to discuss trends, results and current problems in the area of test, diagnosis and reliability of digital, analog, mixed-signal and high-frequency circuits and systems. The exchange of ideas is an essential intention of this workshop. The scope includes contributions discussing industrial practice as well as research.
Workshop Website: http://www.informatik.uni-bremen.de/tuz/2022/
Paper Submission
- Compact presentation of the research results
- Maximum two pages (DIN A4) incl. pictures and bibliography
- Accepted papers will automatically be included in the conference proceedings (without ISBN). These can be extended to up to four pages
Camera-ready version for printing
- Submission as PDF file (2-4 pages, DIN A4)
- IEEE templates are recommended
- Please do not use page numbers or headers, typefaces must be embedded and images should be in sufficient print quality
Posters and presentations
- 25-30 minutes for each presentation including questions
- Posters have to be in size DIN A0 size or smaller. Please bring a printed version
- Submission of the presentation in PowerPoint or as PDF
Members of Program Committee 2022
- J. Alt, Infineon Technologies AG
- W. Anheier, University of Bremen
- B. Becker, University of Freiburg
- R. Drechsler, University of Bremen and DFKI GmbH
- S. Eggersglüß, Siemens Digital Industries Software
- P. Engelke, Infineon Technologies AG
- G. Fey, Hamburg University of Technology
- A.-P. Fonseca-Müller, Bosch Sensortec GmbH
- M. Gössel, University of Potsdam
- S. Hellebrand, Paderborn University
- K. Hofmann, Technical University of Darmstadt
- S. Holst, Kyushu Institute of Technology
- W. Hoppe, Rheinmetall AG
- F. Hopsch, Fraunhofer IIS EAS Dresden
- S. Huhn, University of Bremen and DFKI GmbH
- R. Krenz-Baath, Hamm-Lippstadt UAS
- M. Krstic, University of Potsdam and IHP GmbH
- V. Petrovic, Robert Bosch GmbH
- I. Polian, University of Stuttgart
- F. Pöhl, Apple Inc.
- S. Sattler, University Erlangen-Nürnberg
- M. Sauer, Advantest Europe GmbH
- M. Schillinsky, NXP Semiconductors Germany GmbH
- J. Schlöffel, Siemens Digital Industries Software
- H. Schmidt, IBM Deutschland GmbH
- M. Schölzel, Nordhausen University of Applied Sciences
- J. Sepulveda, Airbus Defence and Space
- M. Tahoori, Karlsruhe Institut of Technology (KIT)
- D. Tille, Infineon Technologies AG
- M. Wahl, University of Siegen
- H.-J. Wunderlich, University of Stuttgart
Dr.-Ing. Sebastian HuhnSenior ResearcherUniversity of BremenBibliothekstrasse 528359 Bremen
E-Mail: huhn@uni-bremen.de
Prof. Dr.-Ing. Görschwin FeyProfessor for Computer EngineeringHamburg University of TechnologyAm Schwarzenberg-Campus 3 (E)21073 Hamburg
E-Mail: goerschwin.fey@tuhh.de