PAINE 2020: International Conference on Physical Assurance and Inspection of Electronics Washington, DC, United States, December 15-16, 2020 |
Conference website | http://paine-conference.org/ |
Submission link | https://easychair.org/conferences/?conf=paine2020 |
Abstract registration deadline | March 30, 2020 |
Submission deadline | March 30, 2020 |
Dear colleagues,
This is to inform you that the “IEEE International conference on Physical Assurance and Inspection on Electronics” (PAINE), is to be held on December 15-16, 2020 in Washington, DC. PAINE is supported by “Reliability Society” and accepted papers will be published in IEEE Xplore after peer review by the PAINE TPC.
PAINE offers an exciting venue to researchers and practitioners in the field of Hardware Security and Trust who research and develop physical assurance and analysis. PAINE brings together experts from government, instrumentation, original component manufacturers (OCMs), original equipment manufacturers (OEMs), and academic researchers together to share ideas and solutions to make electronics devices and systems safe and secure.
Topics covered are including but not limited to:
- Image analysis and artificial intelligence for assurance and inspection
- Novel material and devices for assurance
- Sample Preparation
- PCB trust and assurance
- Chip and PCB level decomposition for assurance
- Side channel assessment (power, timing, EM) for assurance and countermeasures
- FIB/SEM for assurance
- Electro-optical probing using PEM, EOP, EOFM, etc.
- Physical/side channel fingerprinting
- Mod-chip on PCB
- Microprobing and nanoprobing
- Bus-snooping
- Fault injection assessment and countermeasures
- Field-based weakness
- Countermeasures against tampering and decomposition
- Physical/logical shielding, etc.
- FPGA Bitstream protection and vulnerabilities
- Analog & mixed-signal circuits and systems security
- Emerging topics in physical inspection and assurance
- Security primitives: Novel devices, materials, and systems
- Trojans and backdoors: Detection and prevention
- Counterfeit Detection and Anti-Counterfeit Technique
SCHEDULE Full Paper (5 pages): Notification of Acceptance: Camera ready version: |
March
May 25 , 2020 |
CONTACT INFORMATION
Technical Program: Navid Asadi (Program Chair)University of FloridaE-mail: nasadi@ece.ufl.edu
General Information: Mark Tehranipoor (General Chair)University of FloridaE-mail: tehranipoor@ece.ufl.edu
This event is open to public; we encourage everyone from academia, industry, and government to attend.
Best Regards,
PAINE organizing committee