ITC-Asia 2017: International Test Conf. in Asia, 2017 Taipei, Taiwan, September 13-15, 2017 |
Conference website | http://windy.ee.nthu.edu.tw/ITC-Asia-2017/CALL.html |
Abstract registration deadline | February 5, 2017 |
Submission deadline | February 12, 2017 |
With the test technology facing its grand challenges to ensure the quality of ICs and electronic systems incorporating more and more sophisticated manufacturing processes and system integration technologies in various emerging applications such as Internet of Things, cloud computing, automotive electronics, etc., global proliferation and cooperation is increasingly more important. International Test Conference has been a flagship conference in test technology since 1970. With an attempt to stimulate more discussion and interaction between the academia and the industry around the globe, ITC-Asia was initiated and co-located with SEMICON Taiwan in Taipei. Attendee can involve themselves in not only the state-of-the-art test technology trend, but also numerous semiconductor industry forums organized by SEMICON Taiwan.
Key Dates
- Submission of title and abstract: Feb. 5, 2017
- Full paper submission: Feb. 12, 2017
- Notification of acceptance: April 17, 2017
- Camera-ready manuscript: June 5, 2017
Submission Guidelines
Submission Web Page: https://easychair.org/conferences/?conf=itcasia2017
Paper submissions should be made electronically by PDF manuscripts only, not exceeding 6 pages in IEEE 2-column format (including abstract, figures, tables, and bibliography). A submission will be considered evidence that upon acceptance at least one author will attend the conference to make the presentation. Authors of accepted papers are also responsible for preparing the final manuscripts in time to be included in the electronic proceedings, which will eventually be published in IEEE Xplore Digital Library. At least one full registration to the conference is required for each accepted paper. Outstanding papers will be invited to submit an extended version to ITC’17, and Best Paper Award will be elected. The following paper categories are welcome:
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- Design Verification, Validation, and Debug
- Hardware Oriented Security and Trust
- ATE Design
- Analog and Mixed-Signal Test
- RF Test
- High-Speed I/O Test
- Fault Modeling and Simulation
- ATPG (Automatic Test Pattern Generation)
- Design for Testability for Logic Circuits
- Built-In Self-Test for Logic Circuits
- Delay Test
- System-on-Chip Test
- Test Compression
- Test Methods for Low-Power Circuits
- Power-Aware and/or Thermal-Aware Test
- Memory Test, Diagnosis, and Repair
- Fault Diagnosis and Failure Analysis
- Test Methods for Emerging Devices
- MEMS Test
- Sensor Test
- CPU/GPU Test
- Automotive IC Test
- Test Methods for Internet of Things
- Online Test
- On-Chip Measurement
- Reliability Issues
- SiP, 2.5D, and 3D IC Test
- Interconnect Test
- Test Standards
- Test Economics
- Fault Tolerance
- Reconfigurable System Test
- Board-Level Testing and Diagnosis
- Yield Analysis and Learning
Publication
ITC-Asia 2017 proceedings will be published in IEEE Xplore Database
Venue
The conference will be held in Nangang Exhibition Hall, Taipei City, Taiwan
Contact
All questions about submissions should be emailed to ... Shi-Yu Huang (syhuang@ee.nthu.edu.tw)