EXRS-2022: European Conference on X-ray Spectrometry 2022 Oud St. Jan conference centre Brugge, Belgium, June 26-July 1, 2022 |
Conference website | https://www.uantwerpen.be/exrs |
Submission link | https://easychair.org/conferences/?conf=exrs2020 |
Abstract registration deadline | March 31, 2022 |
Submission deadline | March 31, 2022 |
The European Conference on X-Ray Spectrometry (EXRS) is a biennial conference series that started in 1984 in Gothenburg, Sweden. This conference has become a traditional meeting for scientists from around the world working in x-ray spectrometry or using one of its several techniques: X-ray fluorescence (conventional, micro-fluorescence, synchrotron-based and total-reflection), electron microprobe, PIXE, XRD, etc. It represents an exciting discussion forum for basic research and applications of x-ray spectrometry in a rich variety of fields like materials science, chemistry (analysis of materials, quantification), radiation physics, medicine (medical physics, medical imaging), biology, environment, cultural heritage, technology and industry. EXRS is an opportunity to learn more about the latest in theoretical, experimental and applied XRS, to discuss with people from all over the world, to share your own work and to learn from others.
The scientific program consists of invited lectures from distinguished scientists, oral presentations and poster contributions given by the participants and an industrial exhibition, including technical presentations given by the sponsors.
The last three conferences were held in Ljubljana, Slovenia 2018, Gothenburg, Sweden 2016 and Bologna, Italy 2014.
Submission Guidelines
All papers must be original and not simultaneously submitted to another journal or conference. The following paper categories are welcome:
- Oral presentations (15 min speaking time, 5 min question time)
- Posters
List of Topics
- Interactions of X-rays with matter and fundamental parameters
- Quantification, simulation and modelling
- XRS Instrumentation (sources, optics and ED/WD detectors, including mobile devices)
- TXRF and related techniques
- PIXE and electron induced XRS
- Synchrotron radiation
- Microbeams and scanning imaging techniques
- Full field X-ray imaging and tomography
- X-ray absorption and emission spectroscopy; X-ray diffraction
- XRS Applications in biology/health, environment, industrial production, cultural heritage, nano technology, energy, ...
Committees
Program Committee
- Burkhard Beckhoff, PTB, Germany
- Johan Boman, University of Gothenburg, Sweden
- Maria Luisa Carvalho, New University of Lisbon, Portugal
- Roberto Cesareo, University of Sassari, Italy
- Stjepko Fazinić, Ruđer Bošković Institute, Zagreb, Croatia
- Jorge E. Fernandez, Alma Mater Studiorum University of Bologna, Italy
- René Van Grieken, University of Antwerp, Belgium
- Yohichi Gohshi, Yokohama, Japan
- Andreas Karydas, Institute of Nuclear and Particle Physics, NCSR “Demokritos”, Greece
- Matjaz Kavcic, Jožef Stefan Institute, Slovenia
- Marie-Christine Lepy, Laboratoire National Henri Becquerel, Saclay, France
- Jorge Sanchez, University of Cordoba, Argentina
- Szabina Török, Hungarian Academy of Sciences, Budapest, Hungary
- Peter Wobrauschek, Vienna University of Technology, Austria
Organizing committee
- Koen Janssens (University of Antwerp, chair
- Geert Van der Snickt (University of Antwerp)
- Luc Van't dack (University of Antwerp, secretary)
- Laszlo Vincze (Ghent University)
- David Strivay (Liège University)
Invited Speakers (list to be completed)
- Sylvain Bohic, INSERM and European Synchrotron Radiation Facility (ESRF), Grenoble, France Nano-XRF imaging of trace elements in cells and tissues
- Philipp Hoenicke, Physikalisch-Technische Bundesanstalt (PTB), Berlin, Germany Dimensional and compositional characterization of nanostructures using the grazing incidence X-ray fluorescence technique
- Terrence Jach, National Institute of Standards and Technology (NIST), Gaithersburg, MD, USA High-resolution X-ray emission spectroscopy and the effects of life-time broadening
- Katrien Keune, Rijksmuseum and University of Amsterdam, The Netherlands X-ray techniques for investigating artist pigment degradation phenomena and supporting art conservation
- Zoltan Németh, Wigner Research Centre for Physics, Budapest, Hungary High-resolution X-ray absorption and X-ray Emission spectroscopies in the laboratory
- Sofia Pessanha, Laboratory of Instrumentation, Biomedical Engineering and Radiation Physics (LIBPhys), NOVA School of Science and Technology, Lisbon, Portugal Advantages and limitations of portable XRF in environmental and cultural heritage studies
- Tom Schoonjans, Diamond Light Source, Didcot/Oxford, United Kingdom Xraylib: capturing the interaction of X-rays with matter
Publication
The EXRS-2022 proceedings will be published in a dedicated issue of the journal X-ray Spectrometry. Deadline for submission of manuscripts in 31 July 2022.
Registered authors of accepted contributions are invited to submit one manuscript for publication. Please note that no more than one manuscript per conference participant will be considered.
Venue
The conference will be held in Brugge, Belgium in the Confernence Centre "Oud Sint Jan" (Old Saint John), Zonnekemeers, 8000 Brugge, Belgium. This conference centre is situated in the historical centre of Brugge.
Contact
All questions about submissions should be emailed to the conference secretary Mr. Luc Van't Dack (luc.vantdack@uantwerpen.be).