Program for Thursday, September 22nd: Session View

ESREF 2016: 27TH EUROPEAN SYMPOSIUM ON RELIABILITY OF ELECTRON DEVICES, FAILURE PHYSICS AND ANALYSIS

PROGRAM INDEXES

PROGRAM FOR THURSDAY, SEPTEMBER 22ND: SESSION VIEW

Days:

View: with abstracts talk overview

8:30

9:00

9:30

10:00

10:30

11:00

11:30

12:00

12:30

13:00

13:30

14:00

14:30

15:00

15:30

08:30-10:50

Reliability & Failure Mechanisms of MEMS and sensors

08:30-09:30

Reliability & Failure Mechanisms in Packages and Assembly: Tutorial

08:30-09:30

Reliability & Failure Mechanisms of Wide Bandgap Devices: Tutorial

09:30-10:50

Reliability & Failure Mechanisms in Packages and Assembly: Moisture and corrosion related studies

09:30-10:50

Reliability & Failure Mechanisms of Wide Bandgap Devices: Microwave devices

11:10-12:50

Quality and Reliability Assessment – General Techniques and Methods for Devices and Systems: Miscellaneous

11:10-12:50

Reliability & Failure Mechanisms in Packages and Assembly: Reliability and Modelling

11:10-12:50

Reliability & Failure Mechanisms of Wide Bandgap Devices: GaN power devices and deep level transient spectroscopy

12:50-13:50

Poster Session for Tracks A / C / F / H

15:10-15:40

Closing Ceremony

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