PROGRAM FOR THURSDAY, JUNE 20TH
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09:00-09:45 Session 13: Plenary 3
Chairs:
Location: Auditorium
09:00 | The Origin and the Measurement of Phase Noise in Oscillators |
09:45-10:45 Session 14A: Material 3
Chair:
Location: Auditorium
09:45 | Noise spectroscopy-based gas identifying methods to improve the selectivity of MOX gas sensors. PRESENTER: Thierry Contaret |
10:05 | Bulk induced 1/f noise in topological insulators PRESENTER: Saurav Islam |
10:25 | PRESENTER: Mohamed Bouslama |
09:45-10:45 Session 14B: Fundamental Theory 5
Chair:
Location: Room 1
10:45-11:15 Session 15: Coffee break/Poster Session C
10:45 | Low frequency noise of GaSb layers on GaAs substrate PRESENTER: Lukasz Ciura |
10:45 | Using the velocity auto-correlation function to characterize functional ”noise” in bio-molecules PRESENTER: Luca Varani |
10:45 | PRESENTER: Jawar Singh |
10:45 | Effects of mechanical stress on electrical parameters and noise of supercapacitors PRESENTER: Arkadiusz Szewczyk |
11:15-12:45 Session 16A: Devices and Noise Measurements 1
Chair:
Location: Auditorium
11:15 | Noise in electrical double-layer capacitors (EDLCs) PRESENTER: Janusz Smulko |
11:45 | Ultra-low noise, single JFET voltage pre-amplifier for low frequency noise measurements PRESENTER: Carmine Ciofi |
12:05 | Low frequency noise characterization and modeling of SiGe HBT featuring LASER annealing in a 55-nm CMOS node PRESENTER: Johnny El Beyrouthy |
12:25 | Low-Frequency Noise in InGaZnO Thin-Film Transistors with Al2O3 Gate Dielectric PRESENTER: Horacio Londono |
11:15-12:45 Session 16B: Devices and Materials 2
Chair:
Location: Room 1
11:15 | Adhesive Low Frequency Noise (LFN) in Charge Trap Transistors (CTT) for Neuromorphic Analog Processing |
11:35 | Low-frequency noise considerations for sensors based on manganites PRESENTER: Bruno Guillet |
12:05 | Low Noise Characteristics of Schottky Diode with Deep Energy Level PRESENTER: Vladimir Litvinov |