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09:00 | Ultra-Low-Noise Design of CMOS Image Sensors toward Photoelectron-Counting-Based Wide Dynamic Range Imaging |
09:45 | Detection of Shot Noise in Solar Cells and LEDs Using Cross-Correlation Current Noise Spectroscopy PRESENTER: Kevin Davenport |
10:05 | Low frequency noise deviation from Schottky theory in p-n junctions PRESENTER: Jean-Guy Tartarin ABSTRACT. Theories on linear white noise sources such as thermal noise or shot noise are well established and massively used for low noise device modeling and circuit design. However, it has been experienced that diffusion noise in a large variety of pn diodes (transistors) can deviate from the expected value given by the Schottky theorem or by the Van der Ziel representation commonly used. In this work, more than ten types of diodes have been investigated, all featuring an increase of the diffusion noise floor in the low frequency band when operated under low d.c current conditions. These specific conditions certainly explain why such phenomenon has not been reported earlier; however, this noise degradation becomes a problem as many systems make use of pn diodes for low signal photodetection (PPD or CCD), operating at very low (dark) current. We report for the first time current spectral densities deviations from the Shottky theorem; a focus on the experimental workbench is given to remove any doubt regarding the opportunity to analyze data under concern. Then, low frequency noise spectra are presented for various diodes and pn junctions, and a model is proposed. Impedance spectroscopy is also used to support this study. |
09:45 | Noise at low temperature |
10:05 | Low-Frequency Noise of Magnons PRESENTER: Sergey Rumyantsev |
11:05 | Charge carrier dynamics of strongly-correlated electrons in low-dimensional molecular metals studied by fluctuation spectroscopy |
11:35 | Lorentzian noise approach for 1D transport studies PRESENTER: Svetlana Vitusevich |
11:55 | PRESENTER: Carlo Guardiani |
12:15 | Resistivity Characteristics and Noise Spectroscopy of Composites with Carbon Fiber Felts PRESENTER: Marina Tretjak |
11:05 | Noise-induced nonlinear dynamics of high Q nanomechanical resonators |
11:35 | Fluctuation -Dissipation-Dispersion Relation for Slow Processes and Quality Factor for Oscillation Systems |
11:55 | Analysis of the ultimate noise performance of a mesoscopic cavity magnetic sensor PRESENTER: Massimo Macucci |
12:15 | An Itô-Stratonovich dilemma-free treatment for nonlinear oscillators with colored noise PRESENTER: Fabrizio Bonani |
14:00 | Design and realization of ultra-low noise cryoHEMTs for cryogenic readout electronics PRESENTER: Yong Jin |
14:30 | Shot noise and squeezing in the conduction channel of a Field Effect Transistor at ultra-low temperature PRESENTER: Bertrand Reulet |
14:50 | Discussion of the flicker noise origin at very low temperature and polarisation operation PRESENTER: Bogdan Cretu |
15:10 | Generation-recombination noise of magnetic monopoles in spin ice PRESENTER: Alexey Klyuev |
14:00 | Electronic noise due to temperature differences across nanoscale conductors: beyond standard thermal and shot noises |
14:30 | Magneto-Electric Diffusion of Electrons in Gallium Nitride: a Monte Carlo Analysis PRESENTER: Luca Varani |
14:50 | Probabilistic analysis of two models of ideal memristor with external noise PRESENTER: Anna Kharheva |
15:10 | Noise-delayed decay for Levy flights in unstable parabolic potential PRESENTER: Alexander Dubkov |
16:00 | RF Noise Benchmark Tests for MOSFETs PRESENTER: Andries J. Scholten |
16:30 | 1/f Noise in Fully Integrated Electrolytically Gated FinFETs with Fin Width Down to 20nm PRESENTER: Koen Martens |
16:50 | Processing Impact on the Low-Frequency Noise of 1.8 V Input-Output Bulk FinFETs PRESENTER: Cor Claeys |
17:10 | A 4-Terminal Method for Oxide and Semiconductor Trap Characterization in FDSOI MOSFETs PRESENTER: Hung Chi Han |
16:00 | Low-Frequency Noise in Electrochemical Sensors for Water Quality Monitoring PRESENTER: Jamal Deen |
16:30 | Nanoimprint technology for liquid-gated Si nanowire FET biosensors: Noise spectroscopy analysis PRESENTER: Svetlana Vitusevich |
16:50 | Ascorbate Detection Using Single Trap Phenomena in Two-Layer Si NW FETs PRESENTER: Yurii Kutovyi |
17:10 | Noise in Single-Trap Punctual Nanobiosensors PRESENTER: Yurii Kutovyi |