SELSE2020: Silicon Errors in Logic – System Effects Stanford, CA, United States, February 17-20, 2020 |
Conference website | https://www.selse.org/ |
Submission link | https://easychair.org/conferences/?conf=selse2020 |
Abstract registration deadline | December 9, 2019 |
Submission deadline | December 16, 2019 |
The growing complexity and shrinking geometries of modern manufacturing technologies are making devices increasingly susceptible to the influences of electrical noise, process variation, transistor aging, and the effects of natural radiation. The system-level impact of these errors can be far-reaching, both in safety-critical aerospace and automotive applications and also for large scale servers and high performance applications.
The SELSE workshop provides a unique forum for discussion of current research and practice in system-level error management. SELSE solicits papers that address the system-level effects of errors from a variety of perspectives: architectural, logical, circuit-level, and semiconductor processes. Case studies in real-world contexts are also welcome.
We are happy to announce that the best papers presented at SELSE will be selected for inclusion in the “Best of SELSE” session at IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), 2020. These papers will be selected based on the importance of the topic, technical contributions, quality of results, and authors’ agreement to travel to present at DSN in Valencia, Spain on June 29 – July 2, 2020.
Submission Guidelines
Submissions and final papers should be PDF files following the IEEE two-column transactions format with six or fewer printed pages of text; the bibliography does not count against this page limit. Papers are not published through IEEE/ACM nor archived in the digital libraries—however, they are distributed to attendees of the workshop. Submission link: https://easychair.org/my/conference?conf=selse2020#
List of Areas
Key areas of interest include (but are not limited to):
- Error rates and trends in current and emerging technologies, including experimental failure data and reliability characterization of deployed systems.
- New error mitigation techniques, fault-injection tools, robust software frameworks, and error handling protocols for resilient system design.
- Case studies analyzing the overhead, effectiveness, and design complexity of error mitigation techniques.
- Resilience characterization and strategies for machine learning applications.
- Resilience of emerging platforms, cyber-physical and autonomous systems including autonomous vehicles.
- Resilience in new architectures, for example accelerator-rich systems and inexact or approximate computing.
- The design of resilient systems for space exploration.
- The interplay between system security issues and reliability including adversarial attacks/systems.
- Program-level error propagation/characterization and visualization of fault tolerance.
Committees
Program Committee
- TBD
Organizing committee
- John Daly, LPS
- Paolo Rech, UFRGS
- Laura Monroe, LANL (Emerita)
- Stefano Di Carlo, Torino
- Qiang Guan, Kent State
- Michael Sullivan, NVIDIA (Emeritus)
- Sarah Michalak, LANL
- Sandhya Chandrashekhar, Cypress
- Saurabh Hukerikar, NVIDIA
- Karthik Swaminathan, IBM
- Shahrzad Mirkhani, Bigstream
- Mark Gottscho, Google
- Vanessa Job, LANL/UNM
- Tiago Balen, UFRGS
- Yi-Pin Fang, TSMC
Venue
The conference will be held in Stanford, Palo Alto, CA, USA
Contact
All questions about submissions should be emailed to qguan@kent.edu