A-MOST 2018: 14th Workshop on Advances in Model Based Testing Aros Congress Center Västerås, Sweden, April 13, 2018 |
Conference website | https://amost2018.wordpress.com/ |
Submission link | https://easychair.org/conferences/?conf=amost2018 |
Submission deadline | January 19, 2018 |
The increasing complexity of software results in new challenges for testing. Model Based Testing (MBT) continues to be an important research area, where new approaches, methods and tools make MBT techniques more deployable and useful for industry than ever. A-MOST has proven to be a successful workshop that brings researchers and practitioners together discussing formal and semi-formal approaches, specification formats and notations that contribute to simplifying complex aspects of a system. The goal is to bring researchers and practitioners together to discuss state of the art, practice and future prospects in MBT.
Submission Guidelines
All papers must be original and not simultaneously submitted to another journal or conference. The following paper categories are welcome:
- Full and short papers: Papers should not exceed 10 pages (including all text, figures, references and appendices) for full papers or 6 pages for short experience and position papers. Each submitted paper must conform to the IEEE two-column publication format (http://www.ieee.org/conferences_events/conferences/publishing/templates.html). Papers will be reviewed by at least three members from the program committee. Accepted papers will be published in the IEEE Digital Library.
- Abstracts from already published papers: This year we also solicit abstracts from already published papers in relevant well known venues (conferences or journals). These will be selected based on the relevance, quality and importance of the paper. Selected abstracts will be presented and discussed in the workshop, similar to the regular papers, but will not be included in the proceedings. Though, their title and abstracts will be mentioned in the workshop summary.
List of Topics
- The models used in MBT
- The processes, techniques, and tools that support MBT
- Evaluation (i.e., the evaluation of software using MBT and the evaluation of MBT) Models
- Model-based Mutation Testing
- Models for component, integration and system testing
- Product-line models & (Hybrid) embedded system models
- Systems-of-systems models & Architectural models
- Models for orchestration and choreography of services
- Executable models and simulation
- Environment and use models
- Non-functional models and quantitative MBT
- Model-based test generation algorithms
- Application of model checking techniques in model-based testing
- Tracing from requirements model to test models
- Performance and predictability of model-driven development
- Test model evolution during the software lifecycle
- Generation of testing-infrastructures from models
- Combinatorial approaches for MBT Statistical testing
- Estimating dependability (e.g., security, safety, reliability) using MBT
- Coverage metrics and measurements for structural and (non-)functional models
- Cost of testing, economic impact of MBT
- Empirical validation, experiences, case studies using MBT
Committees
Organizing committee
- Paolo Arcaini, Charles University, Czech Republic
- Xavier Devroey, TU Delft, The Netherlands
- João Pascoal Faria, University of Porto, Portugal
Program Committee
- Bernhard K. Aichernig, Graz University of Technology, Austria
- Shaukat Ali, Simula Research Lab, Norway
- Moussa Amrani, University of Namur, Belgium
- Paolo Arcaini, Charles University, Czech Republic
- Aitor Arrieta, Mondragon Goi Eskola Politeknikoa, Spain
- Kirill Bogdanov, University of Sheffield, UK
- Fabrice Bouquet, University of Franche-Comté, France
- Frédéric Dadeau, University of Franche-Comté, France
- Xavier Devroey, TU Delft, The Netherlands
- João Pascoal Faria, University of Porto, Portugal
- Sudipto Ghosh, Colorado State University, USA
- Rob Hierons, Brunel University, UK
- Bruno Legeard, Smartesting, France
- Levi Lúcio, Fortiss, Germany
- Mercedes Merayo, Complutense University of Madrid, Spain
- Brian Nielsen, Aalborg University, Denmark
- Manuel Núñez, Complutense University of Madrid, Spain
- Jeff Offutt, George Mason University, USA
- Ana Paiva, University of Porto, Portugal
- Mike Papadakis, University of Luxembourg, Luxembourg
- Ioannis Parissis, University of Grenoble INP, France
- Gilles Perrouin, University of Namur, Belgium
- Alexandre Petrenko, CRIM, Canada
- José Miguel Rojas, University of Sheffield, UK
- Shuai Wang, Simula Research Lab, Norway
- Franz Wotawa, Graz University of Technology, Austria
Steering Committee
- Rob Hierons, Brunel University, UK
- Manuel Núñez, Universidad Complutense de Madrid, Spain
- Alexander Pretschner, Technische Universität München, Germany
Publication
A-MOST 2018 proceedings will be published in the IEEE Digital Library.
Venue
The workshop is co-located with ICST 2018 in Västerås, Sweden