PROGRAM FOR THURSDAY, NOVEMBER 17TH: TALK VIEW
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9:00
9:30
10:00
10:30
11:00
11:30
12:00
12:30
13:00
13:30
14:00
14:30
15:00
09:00-09:30
T. Nakura, N. Terao, M. Ishida, R. Ikeno, T. Kusaka, T. Iizuka, K. Asada
09:30-10:00
M. Murakami, H. Kobayashi, S.N.B. Mohyar, O. Kobayashi, T. Miki, J. Kojima
10:00-10:30
Takayuki Nakamura, Koji Asami
09:00-09:30
M. Sadi, G. Contreras, D. Tran, J. Chen, L. Winemberg, M. Tehranipoor
09:30-10:00
Suvadeep Banerjee, Abhijit Chatterjee, Jacob A. Abraham
09:00-09:30
Cheng-Hung Wu, Kuen-Jong Lee
09:30-10:00
Huina Chao, Huawei Li, Tiancheng Wang, Xiaowei Li, Bo Liu
10:00-10:30
Kuen-Jong Lee, Pin-Hao Tang, Michael Kochte
09:00-10:30 Special Session - Automotive IC Quality & Reliability: Today's Challenges & Solutions
11:00-12:00 Keynote: Ken Henson, CEO of SRC
13:30-14:00
Stephen Sunter, Alessandro Valerio, Riccardo Miglierina
14:00-14:30
Anthony Coyette, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Georges Gielen
14:30-15:00
Barry Muldrey, Sabyasachi Deyati, Abhijit Chatterjee
13:30-14:00
Pan, Desineni, Sekar, Chittora, Fernandes, Bawaskar, Carulli
14:00-14:30
A Reconfigurable Built-in Memory Self-repair Architecture for Heterogeneous Cores with Embedded BIST
V.R. Devanathan, Sumant Kale
14:30-15:00
M. Johnson, B. Noble, C. Manya, J. Deforge, M. Johnson, J. Crafts
13:30-15:00 Panel: ATE Revisited–Where Are We Today and Where Should We Be Heading?
13:30-15:00 Panel: Test, Validation, and Security for IoTs
13:30-14:00
David Tatman
14:00-14:30
Shrenik Mehta